AD5383 Analog Devices, AD5383 Datasheet - Page 13

• Manufacturer Part Number: AD5383
• Description: 32-Channel 12-Bit 3 V/5 V Single-Supply Voltage-Output DAC
• Manufacturer: Analog Devices

Specifications of AD5383

• Resolution (bits): 12bit
• Dac Update Rate: 167kSPS
• Dac Settling Time: 6µs
• Max Pos Supply (v): +5.5V
• Single-supply: No
• Dac Type: Voltage Out
• Dac Input Format: Par,Ser,SPI

ABSOLUTE MAXIMUM RATINGS
T
Table 9.
Parameter
AV
DV
Digital Inputs to DGND
SDA/SCL to DGND
Digital Outputs to DGND
REFIN/REFOUT to AGND
AGND to DGND
V
Analog Inputs to AGND
MON_IN Inputs to AGND
MON_OUT to AGND
Operating Temperature Range
Storage Temperature Range
JunctionTemperature (T
100-Lead LQFP Package
Reflow Soldering
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although this product features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
Transient currents of up to 100 mA will not cause SCR latch-up.
OUT
A
Commercial (B Version)
θ
Peak Temperature
DD
DD
= 25°C, unless otherwise noted
JA
x to AGND
to AGND
to DGND
Thermal Impedance
J
Max)
1
.
Rating
–0.3 V to +7 V
–0.3 V to +7 V
–0.3 V to DV
–0.3 V to +7 V
–0.3 V to DV
–0.3 V to AV
–0.3 V to +0.3 V
–0.3 V to AV
–0.3 V to AV
–0.3 V to AV
–0.3 V to AV
–40°C to +85°C
–65°C to +150°C
150°C
44°C/W
230°C
DD
DD
DD
DD
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. B | Page 13 of 40
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
AD5383