AT32UC3A3128 Atmel Corporation, AT32UC3A3128 Datasheet - Page 947

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AT32UC3A3128

Manufacturer Part Number
AT32UC3A3128
Description
Manufacturer
Atmel Corporation

Specifications of AT32UC3A3128

Flash (kbytes)
128 Kbytes
Pin Count
144
Max. Operating Frequency
66 MHz
Cpu
32-bit AVR
# Of Touch Channels
32
Hardware Qtouch Acquisition
No
Max I/o Pins
110
Ext Interrupts
110
Usb Transceiver
1
Usb Speed
Hi-Speed
Usb Interface
Device + OTG
Spi
6
Twi (i2c)
2
Uart
4
Lin
4
Ssc
1
Sd / Emmc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
384
Resistive Touch Screen
No
Dac Channels
2
Dac Resolution (bits)
16
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
128
Self Program Memory
YES
External Bus Interface
1
Dram Memory
sdram
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
3.0 to 3.6
Operating Voltage (vcc)
3.0 to 3.6
Fpu
No
Mpu / Mmu
Yes / No
Timers
6
Output Compare Channels
18
Input Capture Channels
12
Pwm Channels
12
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes

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34.5.3.6
34.5.3.7
32072G–11/2011
CANCEL_ACCESS
SYNC
Table 34-21. MEMORY_BLOCK_ACCESS Details (Continued)
The overhead using block word access is 4 cycles per 32 bits of data, resulting in an 88% trans-
fer efficiency, or 2.1 MBytes per second with a 20 MHz TCK frequency.
If a very slow memory location is accessed during a SAB memory access, it could take a very
long time until the busy bit is cleared, and the SAB becomes ready for the next operation. The
CANCEL_ACCESS instruction provides a possibility to abort an ongoing transfer and report a
timeout to the JTAG master.
When the CANCEL_ACCESS instruction is selected, the current access will be terminated as
soon as possible. There are no guarantees about how long this will take, as the hardware may
not always be able to cancel the access immediately. The SAB is ready to respond to a new
command when the busy bit clears.
Starting in Run-Test/Idle, CANCEL_ACCESS is accessed in the following way:
Table 34-22. CANCEL_ACCESS Details
This instruction allows external debuggers and testers to measure the ratio between the external
JTAG clock and the internal system clock. The SYNC data register is a 16-bit counter that
counts down to zero using the internal system clock. The busy bit stays high until the counter
reaches zero.
Starting in Run-Test/Idle, SYNC instruction is used in the following way:
Instructions
DR input value (Data write phase)
DR output value (Data read phase)
DR output value (Data write phase)
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
Details
dddddddd dddddddd dddddddd dddddddd xx
eb dddddddd dddddddd dddddddd dddddddd
xx xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxeb
Details
10011 (0x13)
peb01
1
x
0
947

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