571BJC000107DG Silicon Laboratories Inc, 571BJC000107DG Datasheet - Page 12

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571BJC000107DG

Manufacturer Part Number
571BJC000107DG
Description
Manufacturer
Silicon Laboratories Inc
Datasheet

Specifications of 571BJC000107DG

Lead Free Status / Rohs Status
Compliant
Si570/Si571
Table 11. Environmental Compliance
The Si570/571 meets the following qualification test requirements.
12
Table 12. Programming Constraints and Timing
(V
Mechanical Shock
Mechanical Vibration
Solderability
Gross & Fine Leak
Resistance to Solder Heat
Output Frequency Range
Frequency Reprogramming
Resolution
Internal Oscillator Frequency
Internal Crystal Frequency
Accuracy
Delta Frequency for Continu-
ous Output
Unfreeze to NewFreq
Timeout
Settling time for small
frequency change
Settling time for large
frequency change
DD
= 3.3 V ±10%, T
Parameter
A
= –40 to 85 ºC)
Parameter
Symbol
CKO
M
f
f
XTAL
OSC
RES
F
From center frequency
center frequency after
Maximum variation is
HS_DIV x N1 > = 6
setting NewFreq bit
<±3500 ppm from
>±3500 ppm from
HS_DIV x N1 = 5
center frequency
Test Condition
114.285 MHz
HS_DIV = 4
±2000 ppm
Rev. 1.2
N1 = 1
N1 = 1
1.2125
–3500
4850
MIL-STD-883, Method 2002
MIL-STD-883, Method 2007
MIL-STD-883, Method 2003
MIL-STD-883, Method 1014
MIL-STD-883, Method 2036
Min
970
10
Conditions/Test Method
114.285
0.09
Typ
1.4175
+3500
5670
1134
Max
945
100
10
10
MHz
MHz
MHz
MHz
Unit
GHz
ppm
ppb
ms
ms
µs

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