DS2155L+ Maxim Integrated Products, DS2155L+ Datasheet - Page 27
DS2155L+
Manufacturer Part Number
DS2155L+
Description
IC TXRX T1/E1/J1 1-CHIP 100-LQFP
Manufacturer
Maxim Integrated Products
Datasheet
1.DS2155L.pdf
(238 pages)
Specifications of DS2155L+
Function
Single-Chip Transceiver
Interface
E1, HDLC, J1, T1
Number Of Circuits
1
Voltage - Supply
3.14 V ~ 3.47 V
Current - Supply
75mA
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
100-LQFP
Includes
BERT Generator and Detector, CMI Coder and Decoder, HDLC Controller
Product
Framer
Number Of Transceivers
1
Data Rate
64 Kbps
Supply Voltage (max)
3.465 V
Supply Voltage (min)
3.135 V
Supply Current (max)
75 mA (Typ)
Maximum Operating Temperature
+ 70 C
Minimum Operating Temperature
0 C
Mounting Style
SMD/SMT
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Power (watts)
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
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4.6 JTAG Test Access Port Pins
Signal Name:
Signal Description:
Signal Type:
JTRST is used to asynchronously reset the test access port controller. After power-up, JTRST must be toggled from
low to high. This action sets the device into the JTAG DEVICE ID mode. Normal device operation is restored by
pulling JTRST low. JTRST is pulled high internally by a 10kΩ resistor operation.
Signal Name:
Signal Description:
Signal Type:
This pin is sampled on the rising edge of JTCLK and is used to place the test access port into the various defined
IEEE 1149.1 states. This pin has a 10kΩ pullup resistor.
Signal Name:
Signal Description:
Signal Type:
This signal is used to shift data into JTDI on the rising edge and out of JTDO on the falling edge.
Signal Name:
Signal Description:
Signal Type:
Test instructions and data are clocked into this pin on the rising edge of JTCLK. This pin has a 10kΩ pullup
resistor.
Signal Name:
Signal Description:
Signal Type:
Test instructions and data are clocked out of this pin on the falling edge of JTCLK. If not used, this pin should be
left unconnected.
JTRST
IEEE 1149.1 Test Reset
Input
JTMS
IEEE 1149.1 Test Mode Select
Input
JTCLK
IEEE 1149.1 Test Clock Signal
Input
JTDI
IEEE 1149.1 Test Data Input
Input
JTDO
IEEE 1149.1 Test Data Output
Output
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