KIT_TC1797_SK Infineon Technologies, KIT_TC1797_SK Datasheet - Page 33
![no-image](/images/manufacturer_photos/0/3/327/infineon_technologies_sml.jpg)
KIT_TC1797_SK
Manufacturer Part Number
KIT_TC1797_SK
Description
KIT STARTER AUDO FUTURE TC1797
Manufacturer
Infineon Technologies
Series
Audo Futurer
Type
MCUr
Datasheets
1.SAK-TC1797-512F180E_AC.pdf
(190 pages)
2.KIT_TC1791_SK.pdf
(46 pages)
3.KIT_TC1797_SK.pdf
(101 pages)
4.KIT_TC1797_SK.pdf
(12 pages)
Specifications of KIT_TC1797_SK
Contents
Board, Adapters, Cables, CD, Power Supply
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
For Use With/related Products
TC1797
Other names
KITTC1797SKIN
- SAK-TC1797-512F180E_AC PDF datasheet
- KIT_TC1791_SK PDF datasheet #2
- KIT_TC1797_SK PDF datasheet #3
- KIT_TC1797_SK PDF datasheet #4
- Current page: 33 of 190
- Download datasheet (6Mb)
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Data Flash Features and Functions
Note: Only available in PMU0.
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Data Sheet
Overlay support with SRAM for calibration applications.
Configurable wait state selection for different CPU frequencies.
Endurance = 1000; minimum 1000 program/erase cycles per physical sector;
reduced endurance of 100 per 16 KB sector.
Operating lifetime (incl. Retention): 20 years with endurance=1000.
For further operating conditions see data sheet section “Flash Memory Parameters”.
64 Kbyte on-chip Flash, configured in two independent Flash banks of equal size.
64 bit read interface.
Erase/program one bank while data read access from the other bank.
Programming one bank while erasing the other bank using an automatic
suspend/resume function.
Dynamic correction of single-bit errors during read access.
Sector architecture:
– Two sectors of equal size.
– Each sector separately erasable.
128 byte pages to be written in one step.
Operational control per command sequences (unlock sequences, same as those of
Program Flash) for protection against unintended operation.
End-of-busy as well as error reporting with interrupt and bus error trap.
Write state machine for automatic program and erase.
Margin check for detection of problematic Flash bits.
Endurance = 30000 (can be device dependent); i.e. 30000 program/erase cycles per
sector are allowed, with a retention of min. 5 years.
Dedicated DFlash status information.
Other characteristics: Same as Program Flash.
29
Introduction
V1.1, 2009-04
TC1797
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