ISD-300A1 Cypress Semiconductor Corp, ISD-300A1 Datasheet - Page 48
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ISD-300A1
Manufacturer Part Number
ISD-300A1
Description
IC USB 2.0 BRIDGE BULK 100LQFP
Manufacturer
Cypress Semiconductor Corp
Datasheet
1.ISD-300A1.pdf
(67 pages)
Specifications of ISD-300A1
Applications
USB 2.0 to ATA/ATAPI Bridge
Interface
ATA, ATAPI
Voltage - Supply
3 V ~ 3.6 V
Package / Case
100-LQFP
Mounting Type
Surface Mount
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
428-1459
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ISD-300A1
Manufacturer:
CYP
Quantity:
20 000
October 19, 2001
TEST<3:0> Pins - Test Modes
Table 23 – Test Modes
XCVR Mux-out Mode
These modes of operation are similar to the Normal Mode of operation with various internal transceiver
logic signals brought out through the GPIO and LED pins. These modes are intended only for Cypress
ASIC qualification. The table below shows the mux-out scheme for each mode of operation.
Pin #
38
39
40
42
44
45
46
47
48
49
94
95
0000
0001
0010
0011
0100
0101
0110
0111
1000
1001
1010
1011
1100
1101
1110
1111
TEST(3:0)
ISD-300A1
Pin Name
GPIO0
GPIO1
GPIO2
GPIO3
GPIO4
GPIO5
GPIO6
GPIO7
GPIO8
GPIO9
NLED1
NLED0
Normal Mode - This is the default mode of operation, or run time mode. Pull-downs
are on.
Normal Mode XCVR Muxout – debug mode 1. See XCVR Mux-out Mode below.
Limbo - Setting this mode disables most outputs. See
Limbo Mode below.
Input NandTree – Allows board level manufacturing tests. See Input NandTree
Mode below.
Bi-di NandTree – Allows board level manufacturing tests. See Bi-di NandTree
Mode below.
SimTest – HDL simulation only test mode. Specific GPIO pins are multiplexed in this
mode of operation:
Scan Mode – Fab only test mode
Reserved
Normal Mode XCVR Mux-out – ASIC debug mode 2. See XCVR Mux-out Mode.
Normal Mode XCVR Mux-out – ASIC debug mode 3. See XCVR Mux-out Mode.
Normal Mode XCVR Mux-out – ASIC debug mode 4. See XCVR Mux-out Mode.
Test Bus – SERDES Fab only test mode
Test Bus – ROM Fab only test mode
Test Bus – 256x8 SP SRAM. Fab only test mode
Test Bus – 32x16 DP SRAM. Fab only test mode
Test Bus - 4Kx16 DP SRAM. Fab only test mode
Mode 1 –
XCVR signal
RXERROR
RXBUSACT
RXDOUT(0)
RXDOUT(1)
RXDOUT(2)
RXDOUT(3)
RXDOUT(4)
RXDOUT(5)
RXDOUT(6)
RXDOUT(7)
RXLSTBYT
RXVALID
Short Timers
Short SRAM
Skip Identify
Mode 2 – XCVR
signal
IHSDRVON
CDRCLKEN
CLK_30
CLK_60
LPBACK1
LPBACK0
LOCK
IOST1
IOST0
HSRCVEN
0
PWRDOWN_XCVR
GPIO[2]
GPIO[1]
GPIO[0]
43
Mode Description
TXDIN(0)
TXDIN(2)
TXDIN(4)
TXDIN(5)
TXDIN(6)
Mode 3 –
XCVR signal
TXREADY
TXVALID
TXDIN(1)
TXDIN(3)
TXDIN(7)
RXACTIVE
TXBUSACT
Mode 4 –
XCVR signal
PUE
CLRXVM
CLRSVP
CLRXISE0
CLRSDATA
CNEN
CLRCVEN
CLTXOEN
CLTXOSE0
CLTXDATA
CONTJ
CONTK
ISD-300A1