MT46V16M16P-5B:M Micron Technology Inc, MT46V16M16P-5B:M Datasheet

no-image

MT46V16M16P-5B:M

Manufacturer Part Number
MT46V16M16P-5B:M
Description
IC SDRAM 256MB 200MHZ 66TSOP
Manufacturer
Micron Technology Inc
Series
-r
Datasheet

Specifications of MT46V16M16P-5B:M

Format - Memory
RAM
Memory Type
DDR SDRAM
Memory Size
256M (16Mx16)
Speed
5ns
Interface
Parallel
Voltage - Supply
2.5 V ~ 2.7 V
Operating Temperature
0°C ~ 70°C
Package / Case
66-TSOP (0.400", 10.16mm Width)
Lead Free Status / Rohs Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MT46V16M16P-5B:M
Manufacturer:
ELPIDA
Quantity:
1 400
Part Number:
MT46V16M16P-5B:M
Manufacturer:
MICRON
Quantity:
11 200
Part Number:
MT46V16M16P-5B:M
Manufacturer:
MICRON44
Quantity:
160
Part Number:
MT46V16M16P-5B:M
Manufacturer:
MICRON
Quantity:
20 000
Company:
Part Number:
MT46V16M16P-5B:M
Quantity:
12 000
Double Data Rate (DDR) SDRAM
MT46V64M4 – 16 Meg x 4 x 4 banks
MT46V32M8 – 8 Meg x 8 x 4 banks
MT46V16M16 – 4 Meg x 16 x 4 banks
Features
• V
• Bidirectional data strobe (DQS) transmitted/
• Internal, pipelined double-data-rate (DDR)
• Differential clock inputs (CK and CK#)
• Commands entered on each positive CK edge
• DQS edge-aligned with data for READs; center-
• DLL to align DQ and DQS transitions with CK
• Four internal banks for concurrent operation
• Data mask (DM) for masking write data
• Programmable burst lengths (BL): 2, 4, or 8
• Auto refresh
• Longer-lead TSOP for improved reliability (OCPL)
• 2.5V I/O (SSTL_2-compatible)
• Concurrent auto precharge option supported
Table 1:
PDF: 09005aef80768abb/Source: 09005aef82a95a3a
256Mb_DDR_x4x8x16_D1.fm - 256Mb DDR: Rev. P, Core DDR: Rev. D 2/11 EN
Speed Grade
received with data, that is, source-synchronous data
capture (x16 has two – one per byte)
architecture; two data accesses per clock cycle
aligned with data for WRITEs
(x16 has two – one per byte)
– 64ms, 8192-cycle
t
V
RAS lockout supported (
DD
-75E/-75Z
DD
-5B
-75
6T
= +2.5V ±0.2V, V
-6
= +2.6V ±0.1V, V
Key Timing Parameters
CL = CAS (READ) latency; MIN clock rate with 50% duty cycle at CL = 2 (-75E, -75Z), CL = 2.5 (-6, -6T, -75), and
CL = 3 (-5B)
Products and specifications discussed herein are subject to change by Micron without notice.
CL = 2
133
133
133
133
100
DD
DD
Q = +2.5V ±0.2V
Q = +2.6V ±0.1V (DDR400)
t
RAP =
Clock Rate (MHz)
t
RCD)
CL = 2.5
167
167
167
133
133
1
CL = 3
200
n/a
n/a
n/a
n/a
1
Notes: 1. DDR400 devices operating at < DDR333
Options
• Configuration
• Plastic package – OCPL
• Plastic package
• Timing – cycle time
• Self refresh
• Temperature rating
• Revision
– 64 Meg x 4 (16 Meg x 4 x 4 banks)
– 32 Meg x 8 (8 Meg x 8 x 4 banks)
– 16 Meg x 16 (4 Meg x 16 x 4 banks)
– 66-pin TSOP
– 66-pin TSOP (Pb-free)
– 60-ball FBGA (8mm x 12.5mm)
– 60-ball FBGA (8mm x 12.5mm)
– 5ns @ CL = 3 (DDR400)
– 6ns @ CL = 2.5 (DDR333) FBGA only
– 6ns @ CL = 2.5 (DDR333) TSOP only
– Standard
– Low-power self refresh
– Commercial (0°C to +70°C)
– Industrial (–40°C to +85°C)
– x4, x8, x16
– x4, x8, x16
Data-Out Window
(Pb-free)
Micron Technology, Inc., reserves the right to change products or specifications without notice.
2. Available only on Revision K.
3. Available only on Revision M.
4. Not recommended for new designs.
conditions can use VDD/VDDQ = +2.5V
+0.2V.
1.6ns
2.1ns
2.0ns
2.5ns
2.5ns
256Mb: x4, x8, x16 DDR SDRAM
Window
±0.70ns
±0.70ns
±0.70ns
±0.75ns
±0.75ns
Access
©2003 Micron Technology, Inc. All rights reserved.
DQS–DQ Skew
Marking
+0.40ns
+0.40ns
+0.50ns
Features
+0.45ns
+0.50ns
16M16
64M4
32M8
None
None
-6T
-5B
TG
CV
-6
:K
CY
:M
IT
P
L
2
4
2

Related parts for MT46V16M16P-5B:M

MT46V16M16P-5B:M Summary of contents

Page 1

Double Data Rate (DDR) SDRAM MT46V64M4 – 16 Meg banks MT46V32M8 – 8 Meg banks MT46V16M16 – 4 Meg banks Features • +2.5V ±0.2V ...

Page 2

... BA1) 2K (A0–A9, A11) Yes Yes Yes Yes Yes Yes – Yes – – – – -6/-6T -75E Example Part Number: MT46V16M16P-6T:M - Configuration Package Speed 64 Meg x 4 64M4 32 Meg x 8 32M8 16 Meg x 16 16M16 Package 400-mil TSOP TG 400-mil TSOP (Pb-free) P 8mm x 12 ...

Page 3

FBGA Part Marking System Due to space limitations, FBGA-packaged components have an abbreviated part marking that is different from the part number. For a quick conversion of an FBGA code, see the FBGA Part Marking Decoder on Micron’s Web site: ...

Page 4

Table of Contents State Diagram ...

Page 5

State Diagram Figure 2: Simplified State Diagram Power applied Note: This diagram represents operations within a single bank only and does not capture concur- rent operations in other banks. PDF: 09005aef80768abb/Source: 09005aef82a95a3a DDR_x4x8x16_Core1.fm - 256Mb DDR: Rev. P; Core DDR ...

Page 6

... A bidirectional data strobe (DQS) is transmitted externally, along with data, for use in data capture at the receiver. DQS is a strobe transmitted by the DDR SDRAM during READs and by the memory controller during WRITEs. DQS is edge-aligned with data for READs and center-aligned with data for WRITEs. The x16 offering has two data strobes, one for the lower byte and one for the upper byte. The DDR SDRAM operates from a differential clock (CK and CK#) ...

Page 7

... Functional Block Diagrams The 256Mb DDR SDRAM is a high-speed CMOS, dynamic random-access memory containing 268,435,456 bits internally configured as a 4-bank DRAM. Figure 3: 64 Meg x 4 Functional Block Diagram CKE CK# CK Control CS# logic WE# CAS# RAS# Refresh 13 counter Mode registers 15 13 A0–A12, Address ...

Page 8

... DECODER COLUMN- ADDRESS 9 COUNTER/ LATCH 1 BANK3 BANK2 BANK1 REFRESH COUNTER 13 BANK0 ROW- 13 ADDRESS ROW- BANK0 ADDRESS MUX MEMORY 8192 LATCH ARRAY & (8,192 x 256 x 32) DECODER SENSE AMPLIFIERS 8192 I/O GATING 2 DM MASK LOGIC 32 BANK CONTROL LOGIC 2 256 (x32) COLUMN DECODER ...

Page 9

Pin and Ball Assignments and Descriptions Figure 6: 66-Pin TSOP Pin Assignments (Top View DQ0 DQ1 ...

Page 10

Figure 7: 60-Ball FBGA Ball Assignments (Top View REF REF DQ14 DQ12 DQ10 DQ8 V REF PDF: 09005aef80768abb/Source: ...

Page 11

... Address inputs: Provide the row address for ACTIVE commands, and the column address and auto precharge bit (A10) for READ/ WRITE commands, to select one location out of the memory array in the respective bank. A10 sampled during a PRECHARGE command determines whether the PRECHARGE applies to one bank (A10 LOW, bank selected by BA0, BA1) or all banks (A10 HIGH) ...

Page 12

Table 4: Pin and Ball Descriptions (continued) FBGA TSOP Numbers Numbers Symbol B7, D7, D3, 5, 11, 56, DQ0–DQ2 B3 62 DQ3 E3 51 DQS E7 16 LDQS E3 51 UDQS F8 B2, D2, ...

Page 13

Package Dimensions Figure 8: 66-Pin Plastic TSOP (400 mil) 22.22 ± 0.08 0.65 TYP 0.32 ±0.075 TYP PIN #1 ID Notes: 1. All dimensions in millimeters. 2. Package width and length do not include mold protrusion; allowable mold protrusion is ...

Page 14

Figure 9: 60-Ball FBGA (8mm x 12.5mm) Seating plane A 0.12 A 60X Ø0.45 Solder ball material: eutectic or SAC305. Dimensions apply to solder balls post- reflow on Ø0. NSMD ball pads. 11 CTR 1 TYP Notes: ...

Page 15

Electrical Specifications – I Table 6: II Specifications and Conditions (x4, x8, x16: -5B, -6, -6T) - Die Revision K Only +2.6V ±0.1V 0°C ≤ T ≤ +70°C; Notes: 1–5, 11, 13, 15, 47; ...

Page 16

Table 7: I Specifications and Conditions (x4, x8, x16: -5B, -6, -6T) - Die Revision M Only +2.6V ±0.1V 0°C ≤ T ≤ +70°C; Notes: 1–5, 11, 13, 15, 47; Notes appear on pages ...

Page 17

Electrical Specifications – DC and AC Stresses greater than those listed in Table 8 may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above ...

Page 18

Table 10: DC Electrical Characteristics and Operating Conditions (-6, -6T, -75E, -75Z, -75) Notes: 1–5, 17 apply to the entire table; Notes appear on page 34; V Parameter/Condition Supply voltage I/O supply voltage I/O reference voltage I/O termination voltage (system) ...

Page 19

Figure 10: Input Voltage Waveform Transmitter Notes Numbers in diagram reflect nominal values utilizing circuit below for all devices other than -5B. PDF: 09005aef80768abb/Source: 09005aef82a95a3a DDR_x4x8x16_Core2.fm - 256Mb DDR: Rev. P; Core DDR ...

Page 20

Table 12: Clock Input Operating Conditions Notes: 1–5, 16, 17, 31 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Parameter/Condition Clock input mid-point voltage: CK and CK# Clock input voltage ...

Page 21

Table 13: Capacitance (x4, x8 TSOP) Note: 14 applies to the entire table; Notes appear on page 34 Parameter Delta input/output capacitance: DQ0–DQ3 (x4), DQ0–DQ7 (x8) Delta input capacitance: Command and address Delta input capacitance: CK, CK# Input/output capacitance: DQ, ...

Page 22

Table 17: Electrical Characteristics and Recommended AC Operating Conditions (-5B) Notes 1–6, 16–18, 34 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Characteristics Parameter Access window of DQ from ...

Page 23

Table 17: Electrical Characteristics and Recommended AC Operating Conditions (-5B) (continued) Notes 1–6, 16–18, 34 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Characteristics Parameter Exit SELF REFRESH-to-non-READ command ...

Page 24

Table 18: Electrical Characteristics and Recommended AC Operating Conditions (-6) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Characteristics Parameter Access window of DQ from ...

Page 25

Table 18: Electrical Characteristics and Recommended AC Operating Conditions (-6) (continued) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Characteristics Parameter Write recovery time Internal ...

Page 26

Table 19: Electrical Characteristics and Recommended AC Operating Conditions (-6T) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Characteristics Parameter Access window of DQ from ...

Page 27

Table 19: Electrical Characteristics and Recommended AC Operating Conditions (-6T) (continued) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Characteristics Parameter Write recovery time Internal ...

Page 28

Table 20: Electrical Characteristics and Recommended AC Operating Conditions (-75E) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Characteristics Parameter Access window of DQ from ...

Page 29

Table 20: Electrical Characteristics and Recommended AC Operating Conditions (-75E) (continued) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Characteristics Parameter Write recovery time Internal ...

Page 30

Table 21: Electrical Characteristics and Recommended AC Operating Conditions (-75Z) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Characteristics Parameter Access window of DQ from ...

Page 31

Table 21: Electrical Characteristics and Recommended AC Operating Conditions (-75Z) (continued) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Characteristics Parameter Internal WRITE-to-READ command delay ...

Page 32

Table 22: Electrical Characteristics and Recommended AC Operating Conditions (-75) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Characteristics Parameter Access window of DQ from ...

Page 33

Table 22: Electrical Characteristics and Recommended AC Operating Conditions (-75) (continued) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 34; 0°C ≤ T ≤ +70° Characteristics Parameter Internal WRITE-to-READ command delay ...

Page 34

Notes 1. All voltages referenced Tests for AC timing nominal reference/supply voltage levels, but the related specifications and the device operation are guaranteed for the full voltage range specified. 3. Outputs (except for I Output ...

Page 35

The CK/CK# input reference level (for timing referenced to CK/CK#) is the point at which CK and CK# cross; the input reference level for signals other than CK/CK REF 17. Inputs are not recognized as valid until ...

Page 36

CK and CK# input slew rate must be ≥1 V/ns (≥2 V/ns if measured differentially). Figure 12: Derating Data Valid Window ( 3.0ns 2.5ns 2.0ns 1.5ns 1.0ns 32. DQ and DM input slew rates must not deviate from DQS ...

Page 37

The driver pull-up current variation within nominal limits of voltage and temper- 38e. The full ratio variation of MAX to MIN pull-up and pull-down current should be 38f. The full ratio variation of the nominal pull-up to pull-down current ...

Page 38

The full ratio variation of the MAX-to-MIN pull-up and pull-down current should 39f. The full ratio variation of the nominal pull-up to pull-down current should be Figure 15: Reduced Drive Pull-Down Characteristics ...

Page 39

During initialization, V Alternatively, V provided a minimum of 42Ω of series resistance is used between the V the input pin. 46. The current Micron part operates below 83 MHz (slowest specified JEDEC operating frequency). As such, future die ...

Page 40

Table 25: Normal Output Drive Characteristics Characteristics are specified under best, worst, and nominal process variation/conditions Pull-Down Current (mA) Voltage Nominal Nominal (V) Low High 0.1 6.0 6.8 0.2 12.2 13.5 0.3 18.1 20.1 0.4 24.1 26.6 0.5 29.8 33.0 ...

Page 41

Table 26: Reduced Output Drive Characteristics Characteristics are specified under best, worst, and nominal process variation/conditions Pull-Down Current (mA) Voltage Nominal Nominal (V) Low High 0.1 3.4 3.8 0.2 6.9 7.6 0.3 10.3 11.4 0.4 13.6 15.1 0.5 16.9 18.7 ...

Page 42

Commands Tables 27 and 28 provide a quick reference of available commands. Two additional Truth Tables—Table 29 on page 43 and Table 30 on page 44—provide current state/next state information. Table 27: Truth Table 1 – Commands CKE is HIGH ...

Page 43

Table 29: Truth Table 3 – Current State Bank n – Command to Bank n Notes: 1–6 apply to the entire table; Notes appear below Current State CS# RAS# CAS# Any Idle L L Row active L ...

Page 44

Refreshing: Starts with registration of an AUTO REFRESH command and ends when • Accessing mode register: Starts with registration of an LMR command and ends when • Precharging all: Starts with registration of a PRECHARGE ALL command and ends ...

Page 45

This table describes alternate bank operation, except where noted (that is, the current state is for bank n, and the commands shown are those allowed to be issued to bank m, assuming that bank such a ...

Page 46

Table 32: Truth Table 5 – CKE Notes 1–6 apply to the entire table; Notes appear below CKE CKE Current State n Power-down Self refresh L H Power-down Self refresh H L All banks idle Bank(s) active ...

Page 47

ACTIVE (ACT) The ACTIVE command is used to open (or activate) a row in a particular bank for a subsequent access, like a read or a write, as shown in Figure 17. The value on the BA0, BA1 inputs selects ...

Page 48

READ The READ command is used to initiate a burst read access to an active row, as shown in Figure 18 on page 48. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs ...

Page 49

WRITE The WRITE command is used to initiate a burst write access to an active row as shown in Figure 19. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs A0–Ai and configuration, ...

Page 50

PRECHARGE (PRE) The PRECHARGE command is used to deactivate the open row in a particular bank or the open row in all banks as shown in Figure 20. The value on the BA0, BA1 inputs selects the bank, and the ...

Page 51

Operations INITIALIZATION Prior to normal operation, DDR SDRAMs must be powered up and initialized in a predefined manner. Operational procedures, other than those specified, may result in undefined operation. To ensure device operation, the DRAM must be initialized as described ...

Page 52

Figure 21: INITIALIZATION Flow Diagram Step PDF: 09005aef80768abb/Source: 09005aef82a95a3a DDR_x4x8x16_Core2.fm - 256Mb DDR: Rev. P; Core DDR Rev. D ...

Page 53

Figure 22: INITIALIZATION Timing Diagram ( ( ) ) VTD REF ) ) CK ...

Page 54

... A8, which is self- clearing). Reprogramming the mode register will not alter the contents of the memory, provided it is performed correctly. The mode register must be loaded (reloaded) when all banks are idle and no bursts are in progress, and the controller must wait the specified time before initiating the subsequent operation ...

Page 55

Burst Length (BL) Read and write accesses to the DDR SDRAM are burst oriented, with the burst length being programmable for both READ and WRITE bursts, as shown in Figure 23 on page 54. The burst length determines the maximum ...

Page 56

CAS Latency (CL) The CL is the delay, in clock cycles, between the registration of a READ command and the availability of the first bit of output data. The latency can be set (-5B only) ...

Page 57

Table 34: CAS Latency Speed -5B -6/-6T -75E -75Z -75 Operating Mode The normal operating mode is selected by issuing an LMR command with bits A7–An each set to zero and bits A0–A6 set to the desired values. A DLL ...

Page 58

Figure 25: Extended Mode Register Definition Notes the most significant row address bit from Table 2 on page 2. 2. The QFC# option is not supported. ACTIVE After a row ...

Page 59

Figure 26: Example: Meeting T0 T1 CK# CK Command ACT NOP Address Row Bank x BA0, BA1 READ During the READ command, the value on input A10 determines whether or not auto precharge is used. If auto precharge is selected, ...

Page 60

Data from any READ burst may be truncated with a BURST TERMINATE command, as shown in Figure 31 on page 65. The BURST TERMINATE latency is equal to the CL, that is, the BURST TERMINATE command should be issued x ...

Page 61

Figure 27: READ Burst T0 CK# CK READ Command Bank a, Address Col n DQS DQ T0 CK# CK READ Command Bank a, Address Col n DQS DQ T0 CK# CK READ Command Bank a, Address Col n DQS DQ ...

Page 62

Figure 28: Consecutive READ Bursts T0 CK# CK Command READ Bank, Address Col n DQS DQ T0 CK# CK Command READ Bank, Address Col n DQS DQ T0 CK# CK Command READ Bank, Address Col n DQS DQ Notes: 1. ...

Page 63

Figure 29: Nonconsecutive READ Bursts T0 CK# CK Command READ Bank, Address Col n DQS DQ T0 CK# CK Command READ Bank, Address Col n DQS DQ T0 CK# CK Command READ Bank, Address Col n DQS DQ Notes: 1. ...

Page 64

Figure 30: Random READ Accesses T0 CK# CK Command READ Bank, Address Col n DQS DQ T0 CK# CK Command READ Bank, Address Col n DQS DQ T0 CK# CK Command READ Bank, Address Col n DQS DQ Notes: 1. ...

Page 65

Figure 31: Terminating a READ Burst T0 CK# CK Command READ Bank a, Address Col n DQS DQ T0 CK# CK READ Command Bank a, Address Col n DQS DQ T0 CK# CK Command READ Bank a, Address Col n ...

Page 66

Figure 32: READ-to-WRITE T0 CK# CK Command READ Bank, Address Col n DQS CK# CK Command READ Bank, Address Col n DQS CK# CK READ Command Bank a, Address Col n DQS DQ DM ...

Page 67

Figure 33: READ-to-PRECHARGE T0 CK# CK Command READ Bank a, Address Col n DQS DQ T0 CK# CK Command READ Bank a, Address Col n DQS DQ T0 CK# CK Command READ Bank a, Address Col n DQS DQ Notes: ...

Page 68

Figure 34: Bank READ – Without Auto Precharge CKE Command NOP ACT Row Address A10 Row BA0, ...

Page 69

Figure 35: x4, x8 Data Output Timing – DQ (first data no longer valid) DQ (first data no longer valid) All DQ and DQS collectively t Notes the lesser DQSQ is derived at each ...

Page 70

Figure 36: x16 Data Output Timing – CK# CK LDQS (last data valid (first data no longer valid (last data valid) ...

Page 71

... WRITE burst (after selected, the row will remain open for subsequent accesses. Input data appearing on the DQ is written to the memory array subject to the DM input logic level appearing coincident with the data given DM signal is registered LOW, the corresponding data will be written to memory. If the DM signal is registered HIGH, the corresponding data inputs will be ignored, and a WRITE will not be executed to that byte/column location ...

Page 72

Data for any WRITE burst may be concatenated with or truncated with a subsequent WRITE command. In either case, a continuous flow of input data can be maintained. The new WRITE command can be issued on any positive edge of ...

Page 73

Figure 38: WRITE Burst Command Address t DQSS (NOM) t DQSS (MIN) t DQSS (MAX) Notes data-in for column b. 2. Three subsequent elements of data-in are applied in the programmed order following ...

Page 74

Figure 39: Consecutive WRITE-to-WRITE T0 CK# CK WRITE Command Bank, Address Col b t DQSS (NOM) DQS DQ DM Notes ( data-in from column b (or column n). 2. Three subsequent elements of data-in are ...

Page 75

Figure 40: Nonconsecutive WRITE-to-WRITE Command Address t DQSS (NOM) Notes ( data-in from column b (or column n). 2. Three subsequent elements of data-in are applied in the programmed order following Three ...

Page 76

Figure 42: WRITE-to-READ – Uninterrupting T0 CK# CK Command WRITE Bank a, Address Col DQSS (NOM) DQSS DQS DQSS (MIN) DQSS DQS DQSS (MAX) DQSS DQS DQ ...

Page 77

Figure 43: WRITE-to-READ – Interrupting T0 CK# CK Command WRITE Bank a, Address Col DQSS (NOM) DQSS DQS DQSS (MIN) DQSS DQS DQSS (MAX) DQSS DQS DQ ...

Page 78

Figure 44: WRITE-to-READ – Odd Number of Data, Interrupting T0 CK# CK Command WRITE Bank a, Address Col b t DQSS (NOM) t DQSS DQS DQSS (MIN) t DQSS DQS DQSS (MAX) ...

Page 79

Figure 45: WRITE-to-PRECHARGE – Uninterrupting T0 CK# CK Command WRITE Bank a, Address Col b t DQSS (NOM) t DQSS DQS DQSS (MIN) t DQSS DQS DQSS (MAX) t DQSS DQS DQ ...

Page 80

Figure 46: WRITE-to-PRECHARGE – Interrupting T0 CK# CK Command WRITE Bank a, Address Col b t DQSS (NOM) t DQSS DQS DQSS (MIN) t DQSS DQS DQSS (MAX) t DQSS DQS DQ ...

Page 81

Figure 47: WRITE-to-PRECHARGE – Odd Number of Data, Interrupting T0 CK# CK Command WRITE Bank a, Address Col b t DQSS (NOM) t DQSS DQS DQSS (MIN) t DQSS DQS DQSS (MAX) ...

Page 82

Figure 48: Bank WRITE – Without Auto Precharge CKE NOP 1 Command ACT Row Address A10 Row BA0, ...

Page 83

Figure 49: WRITE – DM Operation CKE ACT NOP Command Row Address A10 Row BA0, BA1 Bank ...

Page 84

Figure 50: Data Input Timing CK# CK DQS DQ DM Notes: 1. WRITE command issued at T0 DSH (MIN) generally occurs during t 3. DSS (MIN) generally occurs during 4. For x16, LDQS controls the lower byte and ...

Page 85

Figure 51: Bank READ – with Auto Precharge CKE ACT NOP Command Address Row A10 Row IS IH BA0, BA1 Bank ...

Page 86

Figure 52: Bank WRITE – with Auto Precharge CKE Command NOP ACT Address Row A10 Row BA0, ...

Page 87

Although not a JEDEC requirement, to provide for future functionality features, CKE must be active (HIGH) during the AUTO REFRESH period. The AUTO REFRESH period begins when the AUTO REFRESH command is registered and ends Figure 53: Auto Refresh Mode ...

Page 88

NOPs for 200 additional clock cycles before applying a READ. Any command other than a READ can be performed reset. NOP or DESELECT commands must be issued during the Figure 54: Self Refresh Mode T1 ...

Page 89

Power-down (CKE Not Active) Unlike SDR SDRAMs, DDR SDRAMs require CKE to be active at all times an access is in progress, from the issuing of a READ or WRITE command, until completion of the access. Thus a clock suspend ...

Page 90

Figure 55: Power-Down Mode CK# CK CKE Command Address DQS DQ DM Notes: 1. Once initialized this command is a PRECHARGE (or if the device is already in the idle state), then the power-down mode shown is ...

Related keywords