QST108KT6 STMicroelectronics, QST108KT6 Datasheet - Page 33

• Manufacturer Part Number: QST108KT6
• Manufacturer: STMicroelectronics

Specifications of QST108KT6

• Lead Free Status / Rohs Status: Compliant

QST108
6.3.3
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU and DLU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electro-static discharge (ESD)
Electro-Static Discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models
can be simulated: Human Body Model and Charge Device Model. These tests comply with
JESD22-A114A/A115A specifications.
Table 25.
1. Data based on characterization results, not tested in production.
Static and dynamic latch-up
●
●
For more details, refer to the application note AN1181.
Table 26.
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the
V
V
Symbol
Symbol
ESD(HBM)
ESD(CDM)
DLU
JEDEC specifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B
Class strictly covers all the JEDEC criteria (international standard).
LU
LU: 3 complementary static tests are required on 10 parts to assess the latch-up
performance. A supply overvoltage (applied to each power supply pin) and a current
injection (applied to each I/O pin) are performed on each sample. This test complies
with EIA/JESD 78 IC latch-up specifications.
DLU: Electro-Static Discharges (one positive then one negative test) are applied to
each pin of 3 samples when the MCU is running to assess the latch-up performance in
Dynamic mode. Power supplies are set to the typical values and the component is put
in Reset mode. This test complies with IEC1000-4-2 and SAEJ1752/3 specifications.
Static latch-up class
Dynamic latch-up class
Electro-static discharge voltage
(Human Body Model)
Electro-static discharge voltage
(Charge Device Model)
Absolute maximum ratings
Electrical sensitivities
Parameter
Ratings
V
T
A
DD
=+125°C
T
T
A
A
=5.5V, f
=+25°C
=+25°C
Conditions
DEVICE
Conditions
= 4MHz, T
Electrical characteristics
Maximum value
A
=+25°C
4000
500
Class
(1)
A
A
33/51
Unit
V
V
(1)