LSM303DLH STMicroelectronics, LSM303DLH Datasheet - Page 12

• Manufacturer Part Number: LSM303DLH
• Description: IC, DIGITAL COMPASS, ±2g ±4g ±8g, LGA-28
• Manufacturer: STMicroelectronics
• Series: -r

Specifications of LSM303DLH

• No. Of Axes: 3
• Ic Interface Type: I2C, Serial
• Sensor Case Style: LGA
• No. Of Pins: 28
• Supply Voltage Range: 2.5V To 3.3V
• Acceleration Range: ± 2g, ± 4g, ± 8g
• Sensing Axis: Triple
• Acceleration: 2 g, 4 g, 8 g
• Sensitivity: 1 mg/digit, 2 mg/digit, 3.9 mg/digit
• Package / Case: LGA-28L
• Output Type: Linear
• Digital Output - Number Of Bits: 16 bit
• Supply Voltage (max): 3.3 V
• Supply Voltage (min): 2.5 V
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 30 C
• Digital Output - Bus Interface: I2C
• Package Type: LGA
• Operating Supply Voltage (min): 2.5V
• Operating Temperature (max): 85C
• Operating Temperature Classification: Commercial
• Product Depth (mm): 5mm
• Product Height (mm): 1mm
• Product Length (mm): 5mm
• Mounting: Surface Mount
• Pin Count: 28
• Sensor Type: Accelerometer and Magnetometer
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• For Use With: 497-10689 - BOARD ADAPTER LSM303DLH DIL24497-10508 - BOARD EVAL FOR MEMS SENSORS

Module specifications
Table 3.
1. Typical specifications are not guaranteed
2. Verified by wafer level test and measurement of initial offset and sensitivity
3. Typical zero-g level offset value after MSL3 preconditioning
4. Offset can be eliminated by enabling the built-in high-pass filter
5. The sign of “Self-test output change” is defined by the CTRL_REG4 STsign bit
6. Self-test output changes with the power supply. “Self-test output change” is defined as
7. Output data reach 99% of final value after 1/ODR+1ms when enabling self-test mode, due to device filtering
12/47
LA_TCOff
LA_TCSo
LA_TyOff
Symbol
M_CAS
LA_Vst
LA_An
M_DF
M_EF
M_ST
OUTPUT[LSb]
M_R
Top
Linear acceleration sensitivity
change vs. temperature
Linear acceleration typical
zero-g level offset
accuracy
Linear acceleration zero-g level
change vs temperature
Acceleration noise density
Linear acceleration self-test
output change
Magnetic cross-axis sensitivity
Maximum exposed field
Magnetic self test
Magnetic resolution
Disturbing field
Operating temperature range
Mechanical characteristics (continued)
(CTRL_REG4 ST bit=1)
(3),(4)
Parameter
(5),(6),(7)
- OUTPUT[LSb]
FS bit set to 00
FS bit set to 00
Max delta from 25 °C
FS bit set to 00
FS bit set to 00
X axis
FS bit set to 00
Y axis
FS bit set to 00
Z axis
Cross field = 0.5 gauss
Happlied = ±3 gauss
No permitting effect on
zero reading
Positive bias mode, GN
bits set to 100 on X, Y axis
Positive bias mode, GN
bits set to 100 on Z axis
Vdd = 3 V
Sensitivity starts to
degrade. User S/R pulse to
restore sensitivity
(CTRL_REG4 ST bit=0)
Doc ID 16941 Rev 1
Test conditions
. 1LSb=4g/4096 at 12bit representation, ±2 g full-scale
(Table
Min.
-30
29), for all axes.
Typ.
±0.01
±0.1
-300
±20
218
300
350
270
255
±1
8
(1)
10000
Max.
+85
20
LSM303DLH
mgauss
µ
m
gauss
gauss
gauss
%FS/
%/°C
g
Unit
LSB
LSB
LSb
LSb
LSb
m
g
°C
/√ Hz
/°C
g