STM32L152-EVAL STMicroelectronics, STM32L152-EVAL Datasheet - Page 16

BOARD EVALUATION FOR STM32L

STM32L152-EVAL

Manufacturer Part Number
STM32L152-EVAL
Description
BOARD EVALUATION FOR STM32L
Manufacturer
STMicroelectronics
Type
MCUr
Datasheets

Specifications of STM32L152-EVAL

New! Us2012 Catalog Page
STM8L-Discovery_STM32L152-EVAL
Contents
Board
Processor To Be Evaluated
STM32L1xxx
Interface Type
UART
Operating Supply Voltage
2 V to 3.6 V
For Use With/related Products
STM32L
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
497-10842
Hardware and layout
2.16
Figure 4.
2.16.1
2.16.2
16/44
VDD
IDD measurement
The built-in IDD measurement circuit implemented allows the consumption measurement of
the STM32L152C6T6 while the MCU is in Run or Low power saving modes.
For IDD measurement the circuit below is implemented on STM32L152-EVAL.
STM32L152-EVAL IDD measurement circuit
Run mode
In Run mode, IDD current is measured using the operational amplifier MAX9938FEUK+
(U10) connected to the 1 Ohm shunt resistor (R36).
In this case IDD_CNT_EN remains high during measurement, so R35 remains in short-
circuit during the measurement because of transistor T4 which remains ON permanently.
Jumper JP4 must be connected between pins 2 and 3.
Low power mode
In Low power modes (Stop or Standby), the operational amplifier MAX9938FEUK+ (U10) is
connected to the 1 KOhm shunt resistor (R35), controlled by the analogue switch T4.
In this case the counter 74HC4060 (U6) enabled by IDD_CNT_EN manages the
measurement timing according to
VDD_MC U
T4
FDC606 P
R36
1[1%]
JP4
S
R35
G
D
1K[1%]
5
4
VDD
U10
MAX9938FEU K +
3
5
3
1
4
3
Doc ID 18141 Rev 1
U9
SN74 L VC1G04DCK T
U12
SN74 L VC1G66DCK T
I/O
C
GND
Figure
VC C
O/I
2
5
5.
1
2
3
4
5
6
7
8
VDD
U6
74LV4060 PW
Q11
Q12
Q13
Q5
Q4
Q6
Q3
GND
VC C
MR
R33
10K
Rtc
Ctc
Q9
Q7
Q8
RS
16
15
14
13
12
11
10
9
VDD
C25
1uF
Oscillator frequency 30KHz
C6
1nF
3
T3
C7
100nF
FDC606 P
R18
15K
R17
30K
4
5
1
2
6
VDD
R26
10K
PA5
PA0
VDD
PC1 3
IDD_CNT_E N
IDD_Measurem ent
IDD_WAKEU P
UM1018

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