MC908GR4CDWE Freescale Semiconductor, MC908GR4CDWE Datasheet - Page 268

IC MCU 4K FLASH 8MHZ 28-SOIC

MC908GR4CDWE

Manufacturer Part Number
MC908GR4CDWE
Description
IC MCU 4K FLASH 8MHZ 28-SOIC
Manufacturer
Freescale Semiconductor
Series
HC08r
Datasheets

Specifications of MC908GR4CDWE

Core Processor
HC08
Core Size
8-Bit
Speed
8MHz
Connectivity
SCI, SPI
Peripherals
LVD, POR, PWM
Number Of I /o
17
Program Memory Size
4KB (4K x 8)
Program Memory Type
FLASH
Ram Size
384 x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 6x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
28-SOIC (7.5mm Width)
Controller Family/series
HC08
No. Of I/o's
21
Ram Memory Size
384Byte
Cpu Speed
8MHz
No. Of Timers
1
Embedded Interface Type
I2C, SCI, SPI
Rohs Compliant
Yes
Processor Series
HC08GR
Core
HC08
Data Bus Width
8 bit
Data Ram Size
384 B
Interface Type
SCI, SPI
Maximum Clock Frequency
8.2 MHz
Number Of Programmable I/os
21
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Development Tools By Supplier
FSICEBASE, DEMO908GZ60E, M68CBL05CE, M68EML08GPGTE
Minimum Operating Temperature
- 40 C
On-chip Adc
8 bit, 6 Channel
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details
Electrical Specifications
23.15 Timer Interface Module Characteristics
23.16 Memory Characteristics
268
Input capture pulse width
Timer input capture period
RAM data retention voltage
FLASH program bus clock frequency
FLASH read bus clock frequency
FLASH page erase time
FLASH mass erase time
FLASH PGM/ERASE to HVEN set up time
FLASH high-voltage hold time
FLASH high-voltage hold time (mass erase)
FLASH program hold time
FLASH program time
FLASH return to read time
FLASH cumulative program HV period
FLASH endurance
FLASH data retention time
1. The minimum period is the number of cycles it takes to execute the interrupt service routine plus 1 t
1. f
2. t
3. t
4. Typical endurance was evaluated for this product family. For additional information on how Freescale defines typical
5. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
Limited endurance (<1 K cycles)
Maximum endurance (> 1 K cycles)
HVEN to 0.
t
Endurance, please refer to Engineering Bulletin EB619.
to 25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618.
rcv
Read
HV
HV
is defined as the time it needs before the FLASH can be read after turning off the high voltage charge pump, by clearing
is defined as the cumulative high voltage programming time to the same row before next erase.
must satisfy this condition: t
is defined as the frequency range for which the FLASH memory can be read.
Characteristic
(4)
Characteristic
(5)
MC68HC908GR8 • MC68HC908GR4 Data Sheet, Rev. 7
nvs
+ t
nvh
+ t
pgs
+ (t
PROG
Symbol
f
t
Read
t
MErase
V
t
t
t
PROG
Erase
t
rcv
HV
t
t
t
× 64) ≤ t
nvhl
RDR
nvs
nvh
pgs
(2)
(3)
(1)
HV
max.
t
TIH
Symbol
Min
100
32k
10k
1.3
0.9
3.6
t
10
30
15
TLTL
1
4
5
5
1
, t
TIL
See Note
100k
Typ
100
1
4
Min
2
(1)
Freescale Semiconductor
cyc
8.4M
Max
1.1
5.5
40
.
Max
4
Cycles
Years
MHz
Unit
Unit
ms
ms
ms
Hz
t
t
μs
μs
μs
μs
μs
μs
V
cyc
cyc

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