MC9S08QG84CFFER Freescale Semiconductor, MC9S08QG84CFFER Datasheet - Page 287

IC MCU 8BIT 8K FLASH 16-QFN

MC9S08QG84CFFER

Manufacturer Part Number
MC9S08QG84CFFER
Description
IC MCU 8BIT 8K FLASH 16-QFN
Manufacturer
Freescale Semiconductor
Series
HCS08r
Datasheet

Specifications of MC9S08QG84CFFER

Core Processor
HCS08
Core Size
8-Bit
Speed
20MHz
Connectivity
I²C, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
12
Program Memory Size
8KB (8K x 8)
Program Memory Type
FLASH
Ram Size
512 x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
16-QFN
Data Bus Width
8 bit
Maximum Clock Frequency
20 MHz
Data Ram Size
512 B
On-chip Adc
Yes
Number Of Programmable I/os
12
Number Of Timers
1
Mounting Style
SMD/SMT
Height
1 mm
Interface Type
I2C, SCI, SPI
Length
5 mm
Maximum Operating Temperature
+ 85 C
Minimum Operating Temperature
- 40 C
Supply Voltage (max)
3.6 V
Supply Voltage (min)
1.8 V
Width
5 mm
For Use With
DEMO9S08QG8E - BOARD DEMO FOR MC9S08QG8
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details
A.11 FLASH Specifications
This section provides details about program/erase times and program-erase endurance for the FLASH
memory.
Program and erase operations do not require any special power sources other than the normal V
For more detailed information about program/erase operations, see the Memory section.
Freescale Semiconductor
1
2
3
4
Supply voltage for program/erase:
Supply voltage for read operation
Internal FCLK frequency
Internal FCLK period (1/FCLK)
Byte program time (random location)
Byte program time (burst mode)
Page erase time
Mass erase time
Program/erase endurance
Data retention
These values are hardware state machine controlled. User code does not need to count cycles. This information supplied for
calculating approximate time to program and erase.
Typical endurance for FLASH was evaluated for this product family on the 9S12Dx64. For additional information on how
Motorola defines typical endurance, please refer to Engineering Bulletin EB619/D, Typical Endurance for Nonvolatile Memory.
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
to 25°C using the Arrhenius equation. For additional information on how Motorola defines typical data retention, please refer
to Engineering Bulletin EB618/D, Typical Data Retention for Nonvolatile Memory.
The frequency of this clock is controlled by a software setting.
T
T = 25°C
L
to T
H
= –40°C to + 125°C
4
2
(2)
Characteristic
1
3
(2)
MC9S08QG8 and MC9S08QG4 Data Sheet, Rev. 5
(2)
Table A-15. FLASH Characteristics
T > 85 °C
T ≤ 85°C
V
Symbol
prog/erase
V
f
t
t
t
t
t
t
FCLK
Mass
D_ret
Burst
Page
Fcyc
Read
prog
10,000
Min
150
1.8
2.1
1.8
15
5
100,000
Typical
20,000
4000
100
Appendix A Electrical Characteristics
9
4
Max
6.67
200
3.6
3.6
3.6
DD
cycles
years
supply.
Unit
t
t
t
t
kHz
Fcyc
Fcyc
Fcyc
Fcyc
μs
V
V
285

Related parts for MC9S08QG84CFFER