ST72F321AR9TA STMicroelectronics, ST72F321AR9TA Datasheet - Page 155

• Manufacturer Part Number: ST72F321AR9TA
• Description: IC MCU 8BIT 60KB FLASH 64-TQFP
• Manufacturer: STMicroelectronics
• Series: ST7r

Specifications of ST72F321AR9TA

• Core Processor: ST7
• Core Size: 8-Bit
• Speed: 8MHz
• Connectivity: I²C, SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 48
• Program Memory Size: 60KB (60K x 8)
• Program Memory Type: FLASH
• Ram Size: 2K x 8
• Voltage - Supply (vcc/vdd): 3.8 V ~ 5.5 V
• Data Converters: A/D 16x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 64-TQFP, 64-VQFP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -

EMC CHARACTERISTICS (Cont’d)
12.7.3 Absolute Maximum Ratings (Electrical
Sensitivity)
Based on two different tests (ESD and LU) using
specific measurement methods, the product is
stressed in order to determine its performance in
terms of electrical sensitivity. For more details, re-
fer to the application note AN1181.
Absolute Maximum Ratings
Notes:
1. Data based on characterization results, not tested in production.
12.7.3.2 Static Latch-Up
■
Electrical Sensitivities
V
V
LU: 2 complementary static tests are required
on 6 parts to assess the latch-up performance.
A supply overvoltage (applied to each power
Symbol
Symbol
ESD(HBM)
ESD(MM)
LU
Electro-static discharge voltage
(Human Body Model)
Electro-static discharge voltage
(Machine Model)
Static latch-up class
Parameter
Ratings
T
T
T
conforming to JESD 78
A
A
A
=+25°C
=+25°C
=+125°C
12.7.3.1 Electro-Static Discharge (ESD)
Electro-Static Discharges (a positive then a nega-
tive pulse separated by 1 second) are applied to
the pins of each sample according to each pin
combination. The sample size depends on the
number of supply pins in the device (3 parts*(n+1)
supply pin). Two models can be simulated: Human
Body Model and Machine Model. This test con-
forms to the JESD22-A114A/A115A standard.
supply pin) and a current injection (applied to
each input, output and configurable I/O pin) are
performed on each sample. This test conforms
to the EIA/JESD 78 IC latch-up standard.
Conditions
Conditions
ST72321Rx ST72321ARx ST72321Jx
Maximum value
2000
200
II level A
Class
1)
1)
155/193
Unit
V