AT32UC3B0512-A2UT Atmel, AT32UC3B0512-A2UT Datasheet - Page 609
AT32UC3B0512-A2UT
Manufacturer Part Number
AT32UC3B0512-A2UT
Description
IC MCU AVR32 512K FLASH 64TQFP
Manufacturer
Atmel
Series
AVR®32 UC3r
Specifications of AT32UC3B0512-A2UT
Core Processor
AVR
Core Size
32-Bit
Speed
60MHz
Connectivity
I²C, IrDA, SPI, SSC, UART/USART, USB
Peripherals
Brown-out Detect/Reset, DMA, POR, PWM, WDT
Number Of I /o
44
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Ram Size
96K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-TQFP, 64-VQFP
Controller Family/series
AT32UC3B
No. Of I/o's
44
Ram Memory Size
96KB
Cpu Speed
60MHz
No. Of Timers
1
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
AT32UC3B0512-A2UT
Manufacturer:
MURATA
Quantity:
11 450
Part Number:
AT32UC3B0512-A2UT
Manufacturer:
ATMEL/爱特梅尔
Quantity:
20 000
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27.5.3.6
27.5.3.7
32059I–06/2010
CANCEL_ACCESS
SYNC
Table 27-21. MEMORY_BLOCK_ACCESS Details (Continued)
The overhead using block word access is 4 cycles per 32 bits of data, resulting in an 88% trans-
fer efficiency, or 2.1 MBytes per second with a 20 MHz TCK frequency.
If a very slow memory location is accessed during a SAB memory access, it could take a very
long time until the busy bit is cleared, and the SAB becomes ready for the next operation. The
CANCEL_ACCESS instruction provides a possibility to abort an ongoing transfer and report a
timeout to the JTAG master.
When the CANCEL_ACCESS instruction is selected, the current access will be terminated as
soon as possible. There are no guarantees about how long this will take, as the hardware may
not always be able to cancel the access immediately. The SAB is ready to respond to a new
command when the busy bit clears.
Starting in Run-Test/Idle, CANCEL_ACCESS is accessed in the following way:
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
Table 27-22. CANCEL_ACCESS Details
This instruction allows external debuggers and testers to measure the ratio between the external
JTAG clock and the internal system clock. The SYNC data register is a 16-bit counter that
counts down to zero using the internal system clock. The busy bit stays high until the counter
reaches zero.
Starting in Run-Test/Idle, SYNC instruction is used in the following way:
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
Instructions
DR input value (Data write phase)
DR output value (Data read phase)
DR output value (Data write phase)
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
Details
dddddddd dddddddd dddddddd dddddddd xx
eb dddddddd dddddddd dddddddd dddddddd
xx xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxeb
Details
10011 (0x13)
peb01
1
x
0
AT32UC3B
609
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