C8051F060-GQ Silicon Laboratories Inc, C8051F060-GQ Datasheet - Page 37

IC 8051 MCU 64K FLASH 100TQFP

C8051F060-GQ

Manufacturer Part Number
C8051F060-GQ
Description
IC 8051 MCU 64K FLASH 100TQFP
Manufacturer
Silicon Laboratories Inc
Series
C8051F06xr
Datasheets

Specifications of C8051F060-GQ

Program Memory Type
FLASH
Program Memory Size
64KB (64K x 8)
Package / Case
100-TQFP, 100-VQFP
Core Processor
8051
Core Size
8-Bit
Speed
25MHz
Connectivity
CAN, EBI/EMI, SMBus (2-Wire/I²C), SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, Temp Sensor, WDT
Number Of I /o
59
Ram Size
4.25K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 2x16b, 8x10b; D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Processor Series
C8051F0x
Core
8051
Data Bus Width
8 bit
Data Ram Size
4.25 KB
Interface Type
CAN/I2C/SMBus/SPI/UART
Maximum Clock Frequency
25 MHz
Number Of Programmable I/os
59
Number Of Timers
5
Operating Supply Voltage
2.7 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
PK51, CA51, A51, ULINK2
Development Tools By Supplier
C8051F060DK
Minimum Operating Temperature
- 40 C
On-chip Adc
8-ch x 10-bit
On-chip Dac
2-ch x 12-bit
No. Of I/o's
59
Ram Memory Size
4352Byte
Cpu Speed
25MHz
No. Of Timers
5
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
336-1214 - DEV KIT FOR F060/F062/F063
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
336-1213

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2.
Parameter
Ambient temperature under bias
Storage Temperature
Voltage on any pin (except VDD, AV+, AVDD, and
Port 0) with respect to DGND
Voltage on any Port 0 Pin with respect to DGND.
Voltage on VDD, AV+, or AVDD with respect to DGND
Maximum Total current through VDD, AV+, AVDD,
DGND, and AGND
Maximum output current sunk by any Port pin
Maximum output current sunk by any other I/O pin
Maximum output current sourced by any Port pin
Maximum output current sourced by any other I/O pin
*
device. This is a stress rating only and functional operation of the devices at those or any other conditions
above those indicated in the operation listings of this specification is not implied. Exposure to maximum
rating conditions for extended periods may affect device reliability.
Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
Absolute Maximum Ratings
Table 2.1. Absolute Maximum Ratings
Rev. 1.2
C8051F060/1/2/3/4/5/6/7
Conditions
*
Min
-0.3
-0.3
-0.3
-55
-65
Typ
Max
VDD +
125
150
800
100
100
0.3
5.8
4.2
50
50
Units
mA
mA
mA
mA
mA
°C
°C
V
V
V
37

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