ATMEGA32L-8AU Atmel, ATMEGA32L-8AU Datasheet - Page 219

• Manufacturer Part Number: ATMEGA32L-8AU
• Description: IC AVR MCU 32K 8MHZ 3V 44TQFP
• Manufacturer: Atmel
• Series: AVR® ATmegar

Specifications of ATMEGA32L-8AU

• Core Processor: AVR
• Core Size: 8-Bit
• Speed: 8MHz
• Connectivity: I²C, SPI, UART/USART
• Peripherals: Brown-out Detect/Reset, POR, PWM, WDT
• Number Of I /o: 32
• Program Memory Size: 32KB (16K x 16)
• Program Memory Type: FLASH
• Eeprom Size: 1K x 8
• Ram Size: 2K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 44-TQFP, 44-VQFP
• Package: 44TQFP
• Device Core: AVR
• Family Name: ATmega
• Maximum Speed: 8 MHz
• Operating Supply Voltage: 3.3|5 V
• Data Bus Width: 8 Bit
• Number Of Programmable I/os: 32
• Interface Type: TWI/SPI/USART
• On-chip Adc: 8-chx10-bit
• Number Of Timers: 3
• Processor Series: ATMEGA32x
• Core: AVR8
• Data Ram Size: 2 KB
• Maximum Clock Frequency: 8 MHz
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWAVR, EWAVR-BL
• Minimum Operating Temperature: - 40 C
• A/d Inputs: 8-Channel, 10-Bit
• Cpu Speed: 8 MIPS
• Eeprom Memory: 1K Bytes
• Input Output: 32
• Interface: I2C/SPI/UART/USART
• Memory Type: Flash
• Number Of Bits: 8
• Package Type: 44-pin TQFP
• Programmable Memory: 32K Bytes
• Timers: 2-8-bit, 1-16-bit
• Voltage, Range: 2.7-5.5 V
• Data Rom Size: 1024 B
• Height: 1 mm
• Length: 10 mm
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 2.7 V
• Width: 10 mm
• For Use With: ATSTK524 - KIT STARTER ATMEGA32M1/MEGA32C1ATSTK600-TQFP32 - STK600 SOCKET/ADAPTER 32-TQFPATSTK600-TQFP44 - STK600 SOCKET/ADAPTER 44-TQFPATSTK600-DIP40 - STK600 SOCKET/ADAPTER 40-PDIP770-1007 - ISP 4PORT ATMEL AVR MCU SPI/JTAG770-1005 - ISP 4PORT FOR ATMEL AVR MCU JTAG770-1004 - ISP 4PORT FOR ATMEL AVR MCU SPIATAVRDRAGON - KIT DRAGON 32KB FLASH MEM AVRATAVRISP2 - PROGRAMMER AVR IN SYSTEMATJTAGICE2 - AVR ON-CHIP D-BUG SYSTEMATSTK500 - PROGRAMMER AVR STARTER KIT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

JTAG Interface
and On-chip
Debug System
Features
Overview
Test Access Port –
TAP
2503Q–AVR–02/11
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The AVR IEEE std. 1149.1 compliant JTAG interface can be used for
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A brief description is given in the following sections. Detailed descriptions for Programming via
the JTAG interface, and using the Boundary-scan Chain can be found in the sections
ming via the JTAG Interface” on page 274
225, respectively. The On-chip Debug support is considered being private JTAG instructions,
and distributed within ATMEL and to selected third party vendors only.
Figure 112
TAP Controller is a state machine controlled by the TCK and TMS signals. The TAP Controller
selects either the JTAG Instruction Register or one of several Data Registers as the scan chain
(Shift Register) between the TDI input and TDO output. The Instruction Register holds JTAG
instructions controlling the behavior of a Data Register.
The ID-Register, Bypass Register, and the Boundary-scan Chain are the Data Registers used
for board-level testing. The JTAG Programming Interface (actually consisting of several physical
and virtual Data Registers) is used for JTAG Serial Programming via the JTAG interface. The
Internal Scan Chain and Break Point Scan Chain are used for On-chip Debugging only.
The JTAG interface is accessed through four of the AVR’s pins. In JTAG terminology, these pins
constitute the Test Access Port – TAP. These pins are:
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JTAG (IEEE std. 1149.1 Compliant) Interface
Boundary-scan Capabilities According to the IEEE std. 1149.1 (JTAG) Standard
Debugger Access to:
Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface
On-chip Debugging Supported by AVR Studio
– All Internal Peripheral Units
– Internal and External RAM
– The Internal Register File
– Program Counter
– EEPROM and Flash Memories
– Extensive On-chip Debug Support for Break Conditions, Including
– AVR Break Instruction
– Break on Change of Program Memory Flow
– Single Step Break
– Program Memory Breakpoints on Single Address or Address Range
– Data Memory Breakpoints on Single Address or Address Range
Testing PCBs by using the JTAG Boundary-scan capability
Programming the non-volatile memories, Fuses and Lock bits
On-chip Debugging
TMS: Test Mode Select. This pin is used for navigating through the TAP-controller state
machine.
TCK: Test Clock. JTAG operation is synchronous to TCK.
TDI: Test Data In. Serial input data to be shifted in to the Instruction Register or Data
Register (Scan Chains).
TDO: Test Data Out. Serial output data from Instruction Register or Data Register.
shows a block diagram of the JTAG interface and the On-chip Debug system. The
and
®
“IEEE 1149.1 (JTAG) Boundary-scan” on page
ATmega32(L)
“Program-
219