HS9-82C37ARH/SAMPLE HARRIS [Harris Corporation], HS9-82C37ARH/SAMPLE Datasheet - Page 11

• Manufacturer Part Number: HS9-82C37ARH/SAMPLE
• Description: Radiation Hardened CMOS High Performance Programmable DMA Controller
• Manufacturer: HARRIS [Harris Corporation]

Harris Space Level Product Flow -8
GAMMA Radiation Verification (Each Wafer) Method 1019,
100% Die Attach
Periodic- Wire Bond Pull Monitor, Method 2011
Periodic- Die Shear Monitor, Method 2019 or 2027
100% Internal Visual Inspection, Method 2010, Condition B
CSI an/or GSI PreCap (Note 5)
100% Temperature Cycle, Method 1010, Condition C,
100% Constant Acceleration, Method 2001, Condition per
100% External Visual
100% Initial Electrical Test
NOTES:
AC Test Circuit
1. Failures from subgroup 1, 7 are used for calculating PDA. The maximum allowable PDA = 5%.
2. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005.
3. Group B, C and D inspections are optional and will not be performed unless required by the P.O. When required, the P.O. should include
4. Group C and/or Group D Generic Data, as defined by MIL-I-38535, is optional and will not be supplied unless required by the P.O. When
5. CSI and/or GSI inspections are optional and will not be performed unless required by theP.O. When required, the P.O. should include
6. Data Package Contents:
All Output Except EOP
EOP
separate line items for Group B Test, Group C Test, Group C Samples, Group D Test and Group D Samples.
required, the P.O. should include a separate line item for Group C Generic Data and/or Group D Generic Data. Generic data is not guar-
anteed to be available and is therefore not available in all cases.
separate line items for CSI PreCap inspection, CSI final inspection, GSI PreCap inspection, and/or GSI final inspection.
• Cover Sheet (Harris Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Harris Part Number, Lot Number, Quantity).
• GAMMA Radiation Report. Contains Cover page, disposition, Rad Dose, Lot Number, Test Package used, Specification Numbers, Test
• Screening, Electrical, and Group A attributes (Screening attributes begin after package seal).
• Group B, C and D attributes and/or Generic data is included when required by the P.O.
• The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed
equipment, etc. Radiation Read and Record data on file at Harris.
by an authorized Quality Representative.
2 Samples/Wafer, 0 Rejects
10 Cycles
Method 5004
DEVICE UNDER TEST
PINS
TEST CONDITION DEFINITION TABLE
OUTPUT FROM
*
Includes Stray and Jig Capacitance
VDD
1.7V
V1
V1
R1
C1
*
TEST POINT
1.6K
510
R1
HS-82C37ARH
100pF
50pF
C1
11
100% Dynamic Burn-In, Condition D, 160 Hours, +125
100% Interim Electrical Test
100% PDA, Method 5004 (Note 1)
100% Final Electrical Test
100% Fine/Gross Leak, Method 1014
100% External Visual, Method 2009
Sample - Group A, Method 5005 (Note 2)
Sample - Group B, Method 5005 (Note 3)
Sample - Group C, Method 5005 (Notes 3 and 4)
Sample - Group D, Method 5005 (Notes 3 and 4)
100% Data Package Generation (Note 6)
CSI and/or GSI Final (Note 5)
AC Testing Input, Output Waveforms
INPUT
VDD -1.5V
VIL -0.4V
Z
Equivalent, Method 1015
OUTPUT
L OR H
2.0V
0.8V
VOH
VOL
VOH
VOH - 0.45V
Spec Number
1.5V
0.45
L OR H
VOH
VOL
OUTPUT
518058
o
Z
C or