s908ey16g2vfar Freescale Semiconductor, Inc, s908ey16g2vfar Datasheet - Page 277

• Manufacturer Part Number: s908ey16g2vfar
• Description: M68hc08 Microcontrollers Microcontroller
• Manufacturer: Freescale Semiconductor, Inc

20.17.2 Conducted Transient Susceptibility
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test
method. The conducted susceptibility is determined by injecting the transient susceptibility signal on each
pin of the microcontroller. The transient waveform and injection methodology are in accordance with IEC
61000-4-2 (ESD) and IEC 61000-4-4 (EFT/B). The transient voltage required to cause performance
degradation on any pin in the tested configuration is greater than or equal to the reported levels unless
otherwise indicated by footnotes below the table.
The susceptibility performance classification is described in the following table.
Freescale Semiconductor
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
Conducted susceptibility,
electrostatic discharge (ESD)
1. Data based on qualification test results. Not tested in production.
2. These pins demonstrate particularly low levels of performance:
Result
A
B
C
D
E
Parameter
No failure
Self-recovering
failure
Soft failure
Hard failure
Damage
MC68HC908EY16A • MC68HC908EY8A Data Sheet, Rev. 1
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return
to normal operation until exposure is removed and the RESET pin is asserted.
The MCU does not perform as designed during exposure. The MCU does not return
to normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
V
Symbol
V
CS_ESD
CS_EFT
Conditions
T
T
V
V
A
A
32 QFP
32 QFP
DD
DD
= +25
= +25
Performance Criteria
= 5 V
= 5 V
o
o
C
C
f
OSC
4/8
4/8
/f
CPU
Result
A
B
C
D
A
B
C
D
Amplitude
(Min)
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
EMC Performance
(1)
Unit
kV
kV
277