JD54LS164BCA National Semiconductor, JD54LS164BCA Datasheet - Page 11

• Manufacturer Part Number: JD54LS164BCA
• Manufacturer: National Semiconductor

Specifications of JD54LS164BCA

• Lead Free Status / Rohs Status: Not Compliant

PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
electrical parameters shall be as specified in table II herein.
conventional and positive when flowing into the referenced terminal.
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535 .
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
4.5 Methods of inspection. Methods of inspection shall be specified and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, and 6 shall be omitted.
a. End-point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall
be maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request.
The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with
the intent specified in test method 1005 of MIL-STD-883.
MIL-M-38510/306E
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