5962-9316603MXA Cypress Semiconductor Corp, 5962-9316603MXA Datasheet - Page 3

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5962-9316603MXA

Manufacturer Part Number
5962-9316603MXA
Description
Manufacturer
Cypress Semiconductor Corp
Datasheet

Specifications of 5962-9316603MXA

Lead Free Status / RoHS Status
Not Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
5962-9316603MXA
Manufacturer:
E2V
Quantity:
20 000
DSCC FORM 2234
APR 97
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
(Copies of these documents are available online at
Standardization Document Order Desk, 700 Robins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
Unless otherwise specified, the issues of these documents are those cited in the solicitation.
(Applications for copies of ASTM publications should be addressed to:
Harbor Drive, West Conshohocken, PA 19428-2959; http://www.astm.org.)
2/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
3/ Must withstand the added P D due to short circuit test e.g.; I OS .
1.3 Absolute maximum ratings. 2/
1.4 Recommended operating conditions.
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein.
AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM)
maximum levels may degrade performance and affect reliability.
DEPARTMENT OF DEFENSE SPECIFICATION
DEPARTMENT OF DEFENSE STANDARDS
DEPARTMENT OF DEFENSE HANDBOOKS
Supply voltage range --------------------------------------------
DC voltage applied to outputs in high Z state -------------
DC input voltage --------------------------------------------------
DC program voltage----------------------------------------------
Maximum power dissipation (P
Lead temperature (soldering, 10 seconds maximum) ---
Thermal resistance, junction-to-case (θ
Junction temperature (T
Storage temperature range-------------------------------------
Temperature under bias-----------------------------------------
Data Retention-----------------------------------------------------
Supply voltage (V
Ground voltage (GND)-------------------------------------------
Input high voltage (V
Input Low voltage (V
Case operating temperature range (T
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
MIL-STD-883
MIL-STD-1835 -
MIL-HDBK-103 -
MIL-HDBK-780 -
ASTM Standard F1192-00
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
-
CC
) --------------------------------------------
IL
IH
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
) ------------------------------------------
) -----------------------------------------
J
)---------------------------------------
-
D
) ----------------------------
Standard Guide for the Measurement of Single Event Phenomena from
Heavy Ion Irradiation of Semiconductor Devices.
C
) --------------------
JC
) -----------------
http://assist.daps.dla.mil/quicksearch/
-0.5 V dc to +7.0 V dc
-0.5 V dc to +7.0 V dc
-3.0 V dc to +7.0 V dc
13.0 V dc
1.0 W 3/
+260°C
See MIL-STD-1835
+175°C
-65°C to +150°C
-55°C to +125°C
10 years (minimum)
4.5 V dc to 5.5 V dc
0.0 V DC
2.0 V dc minimum
0.8 V dc maximum
-55°C to +125°C
SIZE
ASTM International, PO Box C700, 100 Barr
A
REVISION LEVEL
or
http://assist.daps.dla.mil
B
SHEET
5962-93166
or from the
3

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