5962-9316603MXA Cypress Semiconductor Corp, 5962-9316603MXA Datasheet - Page 13

• Manufacturer Part Number: 5962-9316603MXA
• Manufacturer: Cypress Semiconductor Corp

Specifications of 5962-9316603MXA

• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
4.4.1 Group A inspection.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a.
b.
c.
d.
e.
f.
a.
b.
c.
(1) Testing the entire lot using additional built-in test circuitry which allows the manufacturer to verify programmability
(2) If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy
Tests shall be as specified in table IIA herein.
Subgroups 5 and 6 of table I of method 5005 of MIL-STD-883 shall be omitted.
Subgroup 4 (C IN and C OUT measurements) shall be measured only for initial qualification and after any process or
For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table. For device classes Q and V,
O/V (latch-up) tests shall be measured only for initial qualification and after any design or process changes which may
Devices shall be tested for programmability and ac performance compliance to the requirements of group A, subgroups
Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control and
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
DEFENSE SUPPLY CENTER COLUMBUS
design changes which may affect input or output capacitance. Capacitance shall be measured between the designated
terminal and GND at a frequency equal or less than 1 MHz. Sample size is 15 devices with no failures, and all input
and output terminals tested.
subgroups 7 and 8 shall include verifying the functionality of the device.
affect the performance of the device. For device class M, procedures and circuits shall be maintained under document
revision level control by the manufacturer and shall be made available to the preparing activity or acquiring activity upon
request. For device classes Q and V, the procedures and circuits shall be under the control of the device
manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the preparing activity or
acquiring activity upon request. Testing shall be on all pins, on five devices with zero failures. Latch-up test shall be
considered destructive. Information contained in JEDEC Standard EIA/JESD78 may be used for reference.
9, 10, and 11. Either of two techniques is acceptable:
shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005.
A
= +125°C, minimum.
and ac performance without programming the user array. If this is done, the resulting test patterns shall be verified
on all devices during subgroups 9, 10, and 11, group A testing in accordance with the sampling plan specified in
MIL-STD-883, method 5005.
programmability requirements prior to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to
programming (see 3.2.3.2). If more than two devices fail to program, the lot shall be rejected. At the manufacturer's
option, the sample may be increased to 24 total devices with no more than 4 total device failures allowable. Ten
devices from the programmability sample shall be submitted to the requirements of group A, subgroups 9, 10, and
11. If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the sample may be
increased to 20 total devices with no more than 4 total device failures allowable.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
B
SHEET
5962-93166
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