EVAL-ADM1026EB ON Semiconductor, EVAL-ADM1026EB Datasheet - Page 30

• Manufacturer Part Number: EVAL-ADM1026EB
• Description: BOARD EVAL FOR ADM1026
• Manufacturer: ON Semiconductor
• Type: Temperature Sensorr

Specifications of EVAL-ADM1026EB

• Contents: Evaluation Board
• For Use With/related Products: ADM1026
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

Notes:
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low) or two inputs shorted together, the output pattern is
different. Some examples are given in Figure 58 through
Figure 60.
The output pattern is normal until the stuck input is reached.
Because that input is permanently low, neither it nor any
inputs further up the tree can have any effect on the output.
Figure 56. NAND Tree Test Taking Inputs High in Turn
NTESTOUT
In the event of an input being nonfunctional (stuck high or
Figure 58 shows the effect of one input being stuck low.
For a NAND tree test to work, all outputs (INT,
RSTMAIN, RSTSTBY, and PWM) must remain high
during the test.
When generating test waveforms, allow for a typical
propagation delay of 500 ns through the NAND tree.
If any of the inputs shown in Figure 55 are unused, they
should not be connected direct to ground, but via a
resistor such as 10 kW. This allows the automatic test
equipment (ATE) to drive every input high so that the
NAND tree test can be properly carried out.
GPIO16
GPIO15
GPIO14
GPIO13
GPIO12
GPIO11
GPIO10
GPIO9
GPIO8
FAN0
FAN1
FAN2
FAN3
FAN4
FAN5
FAN6
FAN7
SDA
SCL
INT
CI
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Taking GPIO12 high should take the output high. However,
the next input up the tree, GPIO11, is already high, so the
output immediately goes low again, causing a missing pulse
in the output pattern.
NTESTOUT
Figure 57. NAND Tree Test Taking Inputs Low in Turn
NTESTOUT
Figure 59 shows the effect of one input being stuck high.
Figure 58. NAND Tree Test with GPIO11 Stuck Low
GPIO10
GPIO11
GPIO12
GPIO13
GPIO14
GPIO15
GPIO16
GPIO16
GPIO15
GPIO14
GPIO13
GPIO12
GPIO11
GPIO10
GPIO8
GPIO9
GPIO9
GPIO8
FAN7
FAN6
FAN5
FAN4
FAN3
FAN2
FAN1
FAN0
FAN0
FAN1
SDA
SCL
INT
CI