MCP3221DM-PCTL Microchip Technology, MCP3221DM-PCTL Datasheet - Page 14

• Manufacturer Part Number: MCP3221DM-PCTL
• Description: BOARD DEMO FOR PICTAIL MCP3221
• Manufacturer: Microchip Technology
• Series: PICtail™r
• Type: A/Dr

Specifications of MCP3221DM-PCTL

• Number Of Adc's: 1
• Number Of Bits: 12
• Sampling Rate (per Second): 22.3k
• Data Interface: Serial
• Inputs Per Adc: 1 Single Ended
• Voltage Supply Source: Single Supply
• Operating Temperature: -40°C ~ 85°C
• Utilized Ic / Part: MCP3221
• Product: Data Conversion Development Tools
• Resolution: 12 bit
• Interface Type: USB
• Silicon Manufacturer: Microchip
• Silicon Core Number: MCP3221
• Kit Application Type: Data Converter
• Application Sub Type: ADC
• Silicon Family Name: PICtail
• Kit Contents: Board Cables CD Docs
• Rohs Compliant: Yes
• For Use With/related Products: MCP3221
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Contains lead / RoHS non-compliant

MCP3221
4.5
In the ideal A/D converter transfer function, each code
has a uniform width. That is, the difference in analog
input voltage is constant from one code transition point
to the next. Differential nonlinearity (DNL) specifies the
deviation of any code in the transfer function from an
ideal code width of 1 LSB. The DNL is determined by
subtracting the locations of successive code transition
points after compensating for any gain and offset
errors. A positive DNL implies that a code is longer than
the ideal code width, while a negative DNL implies that
a code is shorter than the ideal width.
4.6
Integral nonlinearity (INL) is a result of cumulative DNL
errors and specifies how much the overall transfer
function deviates from a linear response. The method
of measurement used in the MCP3221 A/D converter
to determine INL is the “end-point” method.
4.7
Offset error is defined as a deviation of the code transi-
tion points that are present across all output codes.
This has the effect of shifting the entire A/D transfer
function. The offset error is measured by finding the dif-
ference between the actual location of the first code
transition and the desired location of the first transition.
The ideal location of the first code transition is located
at 1/2 LSB above V
DS21732C-page 14
Differential Non-Linearity (DNL)
Integral Non-Linearity (INL)
Offset Error
SS
.
4.8
The gain error determines the amount of deviation from
the ideal slope of the A/D converter transfer function.
Before the gain error is determined, the offset error is
measured and subtracted from the conversion result.
The gain error can then be determined by finding the
location of the last code transition and comparing that
location to the ideal location. The ideal location of the
last code transition is 1.5 LSBs below full-scale or V
4.9
The average amount of current over the time required
to perform a 12-bit conversion.
4.10
The average amount of current over the time required
to monitor the I
sumes while it is not being addressed is referred to as
“Active Bus” current.
4.11
The average amount of current required while no con-
version is occurring and while no data is being output
(i.e., SCL and SDA lines are quiet).
4.12
I
100 kHz.
4.13
I
400 kHz.
2
2
C specification where the frequency of SCL is
C specification where the frequency of SCL is
Gain Error
Conversion Current (I
Active Bus Current (I
Standby Current (I
I
I
2
2
C Standard Mode Timing
C Fast Mode Timing
2
C bus. Any current the device con-
© 2006 Microchip Technology Inc.
DDS
DDA
DD
)
)
)
DD
.