GNM314R72A102KD01D Murata Electronics North America, GNM314R72A102KD01D Datasheet - Page 29

CAP 4-ARRAY 1000PF 100V X7R 1206

GNM314R72A102KD01D

Manufacturer Part Number
GNM314R72A102KD01D
Description
CAP 4-ARRAY 1000PF 100V X7R 1206
Manufacturer
Murata Electronics North America
Series
GNMr
Datasheet

Specifications of GNM314R72A102KD01D

Capacitance
1000pF
Voltage - Rated
100V
Dielectric Material
Ceramic
Number Of Capacitors
4
Circuit Type
Isolated
Temperature Coefficient
X7R
Tolerance
±10%
Mounting Type
Surface Mount
Package / Case
1206 (3216 Metric)
Height
0.031" (0.80mm)
Size / Dimension
0.126" L x 0.063" W (3.20mm x 1.60mm)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
490-3421-2
!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
No.
14
15
Continued from the preceding page.
Resistance
to
Soldering
Heat
Temperature
Cycle
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
Item
Appearance
Capacitance
Change
Q/D.F.
I.R.
Dielectric
Strength
Appearance
Capacitance
Change
Q/D.F.
I.R.
Dielectric
Strength
The measured and observed characteristics should satisfy the
specifications in the following table.
No defects or abnormalities
Within T2.5% or T0.25pF
(Whichever is larger)
30pF and over: Q U1000
30pF and below:
C: Nominal Capacitance (pF)
More than 10,000MΩ or 500Ω · F (Whichever is smaller)
No defects
The measured and observed characteristics should satisfy the
specifications in the following table.
No defects or abnormalities
Within T2.5% or T0.25pF
30pF and over: Q U1000
30pF and below:
C: Nominal Capacitance (pF)
More than 10,000MΩ or 500Ω · F (Whichever is smaller)
No defects
(Whichever is larger)
Compensating Type
Q U400W20C
Q U400W20C
Temperature
In case "*" is added in capacitance table, please refer to GRM Series Specifications and Test Methods (2) (P.30).
Below GRM Series Specifications and Test Methods (1) are applied to Non "*" PNs in capacitance table.
Specifications
B1, B3, R1, R6, R7, C8
F1, F5, E4: Within T20%
[B1, B3, R6, R7, C8]
W.V.: 100V
W.V.: 50/25V
W.V.: 16/10V: 0.035 max.
W.V.: 6.3/4V
[E4]
W.V.: 25Vmin: 0.025 max.
[F1, F5]
W.V.: 25V min.
W.V.: 16/10V: 0.125 max.
W.V.: 6.3V: 0.15 max.
B1, B3, R1, R6, R7, C8
F1, F5, E4: Within T20%
[R6, R7, C8]
W.V.: 100V
W.V.: 50/25/16/10V
W.V.: 6.3/4V
[E4]
W.V.: 25Vmin: 0.05 max.
[F1, F5]
W.V.: 25V min.
W.V.: 16/10V: 0.125 max.
W.V.: 6.3V: 0.15 max.
GRM Series Specifications and Test Methods (1)
: 0.05 max. (CF0.068µF)
: 0.075 max. (CU0.068µF)
: 0.05 max.
: 0.075 max. (CF3.3µF)
: 0.125 max. (CU3.3µF)
: 0.05 max. (CF0.1µF)
: 0.09 max. (CU0.1µF)
: 0.025 max. (CF0.068µF)
: 0.05 max. (CU0.068µF)
High Dielectric Type
: 0.025 max. (CF10µF)
: 0.035 max. (CU10µF)
: 0.05 max. (CF3.3µF)
: 0.1 max. (CU3.3µF)
: 0.05 max. (CF0.1µF)
: 0.09 max. (CU0.1µF)
: Within T7.5%
: Within T7.5%
Preheat the capacitor at 120 to 150D for 1 minute.
Immerse the capacitor in an eutectic solder or Sn-3.0Ag-0.5Cu
solder solution at 270T5D for 10T0.5 seconds. Set at room
temperature for 24T2 hours, then measure.
#Initial measurement for high dielectric constant type
Perform a heat treatment at 150W0/Y10D for one hour and
then set at room temperature for 24T2 hours.
Perform the initial measurement.
#Preheating for GRM32/43/55
Fix the capacitor to the supporting jig in the same
manner and under the same conditions as (10).
Perform the five cycles according to the four heat treatments
shown in the following table.
Set for 24T2 hours at room temperature, then measure.
#Initial measurement for high dielectric constant type
Perform a heat treatment at 150W0/Y10D for one hour and
then set at room temperature for 24T2 hours.
Perform the initial measurement.
Temp. (D)
Time (min.)
Step
Step
1
2
Temp. W0/Y3
Operating
30T3
Min.
Temperature
1
100 to 120D
170 to 200D
Test Method
Temp.
Room
2 to 3
Continued on the following page.
2
Temp. W3/Y0
Operating
30T3
Max.
3
1 min.
1 min.
Time
Temp.
Room
2 to 3
4
C02E.pdf
27
07.2.6
5

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