MAX1124EGK-TD Maxim Integrated, MAX1124EGK-TD Datasheet - Page 16

• Manufacturer Part Number: MAX1124EGK-TD
• Description: Analog to Digital Converters - ADC
• Manufacturer: Maxim Integrated

Specifications of MAX1124EGK-TD

• Number Of Channels: 1
• Architecture: Pipeline
• Conversion Rate: 250000 KSPs
• Resolution: 10 bit
• Input Type: Single-Ended/Differential
• Snr: 57.1 dB
• Interface Type: LVDS, Parallel
• Operating Supply Voltage: 1.7 V to 1.9 V
• Maximum Operating Temperature: + 85 C
• Package / Case: QFN EP
• Maximum Power Dissipation: 657 mW
• Minimum Operating Temperature: - 40 C
• Number Of Converters: 1
• Voltage Reference: Internal, External

1.8V, 10-Bit, 250Msps Analog-to-Digital Converter
with LVDS Outputs for Wideband Applications
100Ω characteristic impedance from the ADC to the
LVDS load device.
Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. This straight
line can be either a best straight-line fit or a line drawn
between the end points of the transfer function, once
offset and gain errors have been nullified. However, the
static linearity parameters for the MAX1124 are mea-
sured using the histogram method with an input fre-
quency of 10MHz.
Differential nonlinearity is the difference between an
actual step width and the ideal value of 1 LSB. A DNL
error specification of less than 1 LSB guarantees no
missing codes and a monotonic transfer function. The
MAX1124’s DNL specification is measured with the his-
togram method based on a 10MHz input tone.
Figure 11 depicts the aperture jitter (t
sample-to-sample variation in the aperture delay.
Aperture delay (t
falling edge of the sampling clock and the instant when
an actual sample is taken (Figure 11).
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error). The ideal, theoretical
minimum analog-to-digital noise is caused by quantiza-
tion error only and results directly from the ADC’s reso-
lution (N bits):
In reality, other noise sources such as thermal noise,
clock jitter, signal phase noise, and transfer function
nonlinearities are also contributing to the SNR calcula-
tion and should be considered when determining the
SNR in ADC.
SINAD is computed by taking the ratio of the RMS sig-
nal to all spectral components excluding the fundamen-
tal and the DC offset. In case of the MAX1124, SINAD is
computed from a curve fit.
16
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Signal-to-Noise Plus Distortion (SINAD)
Dynamic Parameter Definitions
Static Parameter Definitions
SNR
dB[max]
Differential Nonlinearly (DNL)
AD
Signal-to-Noise Ratio (SNR)
) is the time defined between the
Integral Nonlinearity (INL)
= 6.02
dB
x N + 1.76
Aperture Delay
Aperture Jitter
AJ
), which is the
dB
SFDR is the ratio of RMS amplitude of the carrier fre-
quency (maximum signal component) to the RMS value
of the next-largest noise or harmonic distortion compo-
nent. SFDR is usually measured in dBc with respect to
the carrier frequency amplitude or in dBFS with respect
to the ADC’s full-scale range.
The two-tone IMD is the ratio expressed in decibels of
either input tone to the worst 3rd-order (or higher) inter-
modulation products. The individual input tone levels
are at -7dB full scale.
For the latest package outline information and land patterns, go
to www.maxim-ic.com/packages.
Figure 11. Aperture Jitter/Delay Specifications
Two-Tone Intermodulation Distortion (IMD)
MAX1122
MAX1123
MAX1121
PACKAGE TYPE
68 QFN-EP
PART
Spurious-Free Dynamic Range (SFDR)
Pin-Compatible Higher Speed/
DATA (T/H)
SAMPLED
ANALOG
INPUT
CLKN
Lower Resolution Versions
CLKP
T/H
t
AD
TRACK
RESOLUTION
PACKAGE CODE
Package Information
(Bits)
10
10
G6800-4
8
t
HOLD
AJ
SPEED GRADE
DOCUMENT NO.
TRACK
(Msps)
21-0122
170
210
250