IS43DR32800A-5BBL ISSI, IS43DR32800A-5BBL Datasheet - Page 24

• Manufacturer Part Number: IS43DR32800A-5BBL
• Description: DRAM 256M (8Mx32) 200MHz Commercial Temp
• Manufacturer: ISSI

Specifications of IS43DR32800A-5BBL

• Product Category: DRAM
• Rohs: yes
• Data Bus Width: 32 bit
• Package / Case: WBGA-126
• Memory Size: 256 Mbit
• Maximum Clock Frequency: 400 MHz
• Access Time: 0.6 ns
• Supply Voltage - Max: 1.9 V
• Supply Voltage - Min: 1.7 V
• Maximum Operating Current: 210 mA
• Maximum Operating Temperature: + 70 C
• Minimum Operating Temperature: 0 C
• Mounting Style: SMD/SMT
• Factory Pack Quantity: 162

IS43DR32800A, IS43/46DR32801A
20. Input waveform timing tDS with differential data strobe enabled is referenced from the input signal crossing at
the VIH(ac) level to the differential data strobe crosspoint for a rising signal, and from the input signal crossing at the
VIL(ac) level to the differential data strobe crosspoint for a falling signal applied to the device under test. DQS, DQS
signals must be monotonic between Vil(dc)max and Vih(dc)min.
21. Input waveform timing tDH with differential data strobe enabled is referenced from the differential data strobe
crosspoint to the input signal crossing at the VIH(dc) level for a falling signal and from the differential data strobe
crosspoint to the input signal crossing at the VIL(dc) level for a rising signal applied to the device under test. DQS,
DQS signals must be monotonic between Vil(dc)max and Vih(dc)min.
22. Input waveform timing is referenced from the input signal crossing at the VIH(ac) level for a rising signal and
VIL(ac) for a falling signal applied to the device under test.
23. Input waveform timing is referenced from the input signal crossing at the VIL(dc) level for a rising signal and
VIH(dc) for a falling signal applied to the device under test.
24. tWTR is at lease two clocks (2 x tCK or 2 x nCK) independent of operation frequency.
25. Input waveform timing with single-ended data strobe enabled, is referenced from the input signal crossing at the
VIH(ac) level to the single-ended data strobe crossing VIH/L(dc) at the start of its transition for a rising signal, and
from the input signal crossing at the VIL(ac) level to the single-ended data strobe crossing VIH/L(dc) at the start of its
transition for a falling signal applied to the device under test. The DQS signal must be monotonic between Vil(dc)max
and Vih(dc)min.
26. Input waveform timing with single-ended data strobe enabled, is referenced from the input signal crossing at the
VIH(dc) level to the single-ended data strobe crossing VIH/L(ac) at the end of its transition for a rising signal, and
from the input signal crossing at the VIL(dc) level to the single-ended data strobe crossing VIH/L(ac) at the end of its
transition for a falling signal applied to the device under test. The DQS signal must be monotonic between Vil(dc)max
and Vih(dc)min.
27. tCKEmin of 3 clocks means CKE must be registered on three consecutive positive clock edges. CKE must remain
at the valid input level the entire time it takes to achieve the 3 clocks of registration. Thus, after any CKE transition,
CKE may not transition from its valid level during the time period of tIS + 2 x tCK + tIH.
28. If tDS or tDH is violated, data corruption may occur and the data must be re-written with valid data before a valid
READ can be executed.
29. These parameters are measured from a command/address signal (CKE, CS, RAS, CAS, WE, ODT, BA0, A0, A1,
etc.) transition edge to its respective clock signal (CK/CK) crossing. The spec values are not affected by the amount
of clock jitter applied (i.e. tJIT(per), tJIT(cc), etc.), as the setup and hold are relative to the clock signal crossing that
latches the command/address. That is, these parameters should be met whether clock jitter is present or not.
30. These parameters are measured from a data strobe signal (DQS/DQS) crossing to its respective clock signal (CK/
CK) crossing. The spec values are not affected by the amount of clock jitter applied (i.e. tJIT(per), tJIT(cc), etc.), as
these are relative to the clock signal crossing. That is, these parameters should be met whether clock jitter is present
or not.
31. These parameters are measured from a data signal (DM, DQ0, DQ1, etc.) transition edge to its respective data
strobe signal (DQS/ DQS) crossing.
32. For these parameters, the DDR2 SDRAM device is characterized and verified to support tnPARAM = RU{tPARAM
/ tCK(avg)}, which is in clock cycles, assuming all input clock jitter specifications are satisfied.
For example, the device will support tnRP = RU{tRP / tCK(avg)}, which is in clock cycles, if all input clock jitter
specifications are met. This means: For DDR2-667 5-5-5, of which tRP = 15ns, the device will support tnRP = RU{tRP
/ tCK(avg)} = 5, i.e. as long as the input clock jitter specifications are met, Precharge command at Tm and Active
command at Tm+5 is valid even if (Tm+5 - Tm) is less than 15ns due to input clock jitter.
Integrated Silicon Solution, Inc. — www.issi.com
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Rev. 00E
09/08/2010