ISPGDXTMFAMILY LATTICE [Lattice Semiconductor], ISPGDXTMFAMILY Datasheet - Page 7

• Manufacturer Part Number: ISPGDXTMFAMILY
• Description: In-System Programmable Generic Digital CrosspointTM
• Manufacturer: LATTICE [Lattice Semiconductor]

3-state levels are measured 0.5V from steady-state
active level.
Output Load Conditions
1. One output at a time for a maximum duration of one second. V
2. Typical values are at V
3. I
SYMBOL
Switching Test Conditions
DC Electrical Characteristics
V
V
I
I
I
I
I
I
I
Input Pulse Levels
Input Rise and Fall Time
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
degradation. Characterized but not 100% tested.
e.g. An input driving four I/O cells at 40 MHz results in a dynamic I
IL
IH
IL-isp
IL-PU
OS
CCQ
CC
A
B
C
CC
OL
OH
1
/ MHz = (0.0114 x I/O cell fanout) + 0.06
TEST CONDITION
Active High
Active Low
Active High to Z
at V -0.5V
Active Low to Z
at V +0.5V
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
ispEN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Quiescent Power Supply Current
Dynamic Power Supply Current
per Input Switching
OH
OL
PARAMETER
CC
= 5V and T = 25
160
160
160
Over Recommended Operating Conditions
R1
A
See figure at right
1.5ns 10% to 90%
GND to 3.0V
o
C.
90
90
90
90
90
R2
1.5V
1.5V
I
I
0V
3.5V
0V
0V
V
V
One input toggling @ 50% duty cycle,
outputs open.
OL
OH
Table 2 - 0004A
CC
IL
=24 mA
=-24 mA
= 0.5V, V
= 5V, V
35pF
35pF
35pF
5pF
5pF
V
V
V
CL
IN
IN
IN
V
IN
V
V
V
OUT
IL
IL
IL
CONDITION
V
7
IH
OUT
(MAX.)
(MAX.)
CC
= V
Specifications ispGDX Family
= 0.5V, T
= 0.5V was selected to avoid test problems by tester ground
CC
*
CC
Device
Output
C L includes Test Fixture and Probe Capacitance.
of approximately ((0.0114 x 4) + 0.06) x 40 = 4.2 mA.
A
= 25˚C
MIN.
-100
2.4
+ 5V
–
–
–
–
–
–
–
R 1
R 2
TYP.
Note 3
See
25
–
–
–
–
–
–
–
2
C L
MAX.
-150
-150
-250
0.55
-10
10
40
*
–
–
mA/MHz
UNITS
Point
Test
mA
mA
V
V
A
A
A
A