ST7FLITE29 STMICROELECTRONICS [STMicroelectronics], ST7FLITE29 Datasheet - Page 103

• Manufacturer Part Number: ST7FLITE29
• Description: 8-BIT MCU WITH SINGLE VOLTAGE FLASH MEMORY, DATA EEPROM, ADC, TIMERS, SPI
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

13.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
13.7.1 Functional EMS
(Electro Magnetic Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
Figure 66. EMC Recommended power supply connection
Notes:
1. Data based on characterization results, not tested in production.
2. The suggested 10 F and 0.1 F decoupling capacitors on the power supply lines are proposed as a good price vs. EMC
performance tradeoff. They have to be put as close as possible to the device power supply pins. Other EMC recommen-
dations are given in other sections (I/Os, RESET, OSCx pin characteristics).
Symbol
V
V
FESD
FFTB
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
Fast transient voltage burst limits to be ap-
plied through 100pF on V
to induce a functional disturbance
V
DD
Parameter
DD
ST7
DIGITAL NOISE
FILTERING
and V
DD
pins
10 F
V
conforms to IEC 1000-4-2
V
conforms to IEC 1000-4-4
DD
DD
0.1 F
A device reset allows normal operations to be re-
sumed.
5V, T
5V, T
ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
Conditions
A
A
2)
+25°C, f
+25°C, f
V
V
DD
SS
OSC
OSC
ST72XXX
8MHz
8MHz
Neg
-1.2
-1
DD
1)
and V
Pos
>1.5
1
ST7LITE2
SS
1)
through
103/131
Unit
kV