ZLF645 MAXIM [Maxim Integrated Products], ZLF645 Datasheet - Page 74

• Manufacturer Part Number: ZLF645
• Description: Flash MCUs with Learning Amplification
• Manufacturer: MAXIM [Maxim Integrated Products]

Table 31. TEST Mode Register (TESTMODE)
Exiting ICP Mode
19-4572; Rev 0; 4/09
Bit Position
[7:3]
[2]
[1:0]
Bits
Field
Reset
R/W
TEST Mode Register
R/W
7
0
The TEST Mode register is used to enable various device test or Flash memory access
modes. At present this register only provides configuration for a single mode where, once
programmed, Flash memory accesses bypass the devices Flash Controller and are done
through the devices I/O pins. A complete description of this mode is available in the Flash
Byte Programming Interface section. This register can only be read or written using the
ICP Read/Write Test Mode Register commands.
The ZLF645 MCU is taken out of ICP mode under any of the following conditions:
•
•
Value
Initiating a POR with P36 held High during the entire reset period.
Lowering V
—
—
1
0
R
6
0
Description
Reserved — Must be written to 1. Reads return 0.
Flash Controller Bypass Mode
The device is not in Flash Controller Bypass Mode.
The device is in Flash Controller Bypass mode.
Reserved —Must be written to 1. Reads return 0.
DD
Reserved F
until the ZLF645 MCU reaches a Voltage Brownout reset state.
R
5
0
R
4
0
R
3
0
Bypass Mode
lash Controller
R/W
2
0
ZLF645 Series Flash MCUs
Product Specification
R
1
0
Reserved
Exiting ICP Mode
R
0
0
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