emif02-600fu7 STMicroelectronics, emif02-600fu7 Datasheet - Page 5

• Manufacturer Part Number: emif02-600fu7
• Description: 10-bit Wide Filter Incudingesd Protection
• Manufacturer: STMicroelectronics

Fig A5 : Remaining voltage at both stages S1 (Vin) and S2 (Vout) during ESD surge
Please note that the EMIF02-600FU7 is not only acting for positive ESD surges but also for negative ones. For these kind
of disturbances it clamps close to ground voltage as shown in Fig. A5b.
NOTE: DYNAMIC RESISTANCE MEASUREMENT
As the value of the dynamic resistance remains stable for a
surge duration lower than 20 s, the 2.5 s rectangular surge
is well adapted. In addition both rise and fall times are
optimized to avoid any parasitic phenomenon during the
measurement of Rd.
CROSSTALK BEHAVIOR
1- Crosstalk phenomena
Fig A7 : Crosstalk phenomena
The crosstalk phenomena are due to the coupling between 2 lines. The coupling factor (
gap across lines decreases, particularly in silicon dice. In the example above the expected signal on load R
fact the real voltage at this point has got an extra value 21V
crosstalk phenomenon of the line 1 on the line 2. This phenomenon has to be taken into account when the drivers impose
fast digital data or high frequency analog signals in the disturbing line. The perturbed line will be more affected if it works
with low voltage signal or high load impedance (few k ). The following chapters give the value of both digital and analog
crosstalk.
V
G1
V
G2
a) Positive surge
DRIVERS
R
G1
R
G2
line 1
line 2
G1
Fig A6 : Rd measurement current wave
. This part of the V
RECEIVERS
R
L2
I
PP
I
R
b) Negative surge
L1
2.5 s duration measurement wave
G1
signal represents the effect of the
V
G2
2.5 s
12
2 s
or
V
G1
V
21
G1
EMIF02-600FU7
) increases when the
V
G2
L2
t t
is 2V
G2
5/9
, in