gs8160e32bt-250v GSI Technology, gs8160e32bt-250v Datasheet - Page 14
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gs8160e32bt-250v
Manufacturer Part Number
gs8160e32bt-250v
Description
1m X 18, 512k X 32, 512k X 36 18mb Sync Burst Srams
Manufacturer
GSI Technology
Datasheet
1.GS8160E32BT-250V.pdf
(23 pages)
AC Test Conditions
DC Electrical Characteristics
DC Output Characteristics (1.8 V/2.5 V Version)
Rev: 1.01 5/2006
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Notes:
1.
2.
3.
Include scope and jig capacitance.
Test conditions as specified with output loading as shown in Fig. 1
unless otherwise noted.
Device is deselected as defined by the Truth Table.
Output reference level
Input reference level
1.8 V Output High Voltage
2.5 V Output High Voltage
1.8 V Output Low Voltage
2.5 V Output Low Voltage
Output Leakage Current
Input Leakage Current
Input high level
Input slew rate
FT, ZZ Input Current
Input low level
(except mode pins)
Parameter
Output load
Parameter
Parameter
Conditions
V
Symbol
Symbol
DD
V
V
V
V
V
1 V/ns
V
Fig. 1
0.2 V
I
DDQ
I
OH1
OH2
I
OL1
OL2
OL
IN
DD
IL
– 0.2 V
/2
/2
14/23
Output Disable, V
I
OH
I
OH
= –8 mA, V
Test Conditions
Test Conditions
= –4 mA, V
V
V
DD
DQ
IN
I
I
OL
OL
≥ V
= 0 to V
= 4 mA
= 8 mA
IN
DDQ
OUT
DDQ
≥ 0 V
DD
= 2.375 V
* Distributed Test Jig Capacitance
= 0 to V
Output Load 1
= 1.6 V
Figure 1
DD
V
DDQ/2
50Ω
GS8160ExxBT-xxxV
V
DDQ
–100 uA
© 2004, GSI Technology
–1 uA
–1 uA
1.7 V
Min
Min
—
—
– 0.4 V
Preliminary
30pF
*
100 uA
Max
Max
0.4 V
0.4 V
1 uA
1 uA
—
—