mc9s08ac16 Freescale Semiconductor, Inc, mc9s08ac16 Datasheet - Page 299

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mc9s08ac16

Manufacturer Part Number
mc9s08ac16
Description
Hcs08 Microcontrollers 8-bit Microcontrollers
Manufacturer
Freescale Semiconductor, Inc
Datasheet

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Appendix A
Electrical Characteristics and Timing Specifications
A.1
This section contains electrical and timing specifications.
A.2
The electrical parameters shown in this supplement are guaranteed by various methods. To give the
customer a better understanding, the following classification is used and the parameters are tagged
accordingly in the tables where appropriate:
A.3
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not
guaranteed. Stress beyond the limits specified in
permanent damage to the device. For functional operating conditions, refer to the remaining tables in this
section.
This device contains circuitry protecting against damage due to high static voltage or electrical fields;
however, it is advised that normal precautions be taken to avoid application of any voltages higher than
maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused
inputs are tied to an appropriate logic voltage level (for instance, either V
Freescale Semiconductor
C
D
P
T
Parameter Classification
Introduction
Absolute Maximum Ratings
Those parameters are guaranteed during production testing on each individual device.
Those parameters are achieved by the design characterization by measuring a
statistically relevant sample size across process variations.
Those parameters are achieved by design characterization on a small sample size from
typical devices under typical conditions unless otherwise noted. All values shown in
the typical column are within this category.
Those parameters are derived mainly from simulations.
The classification is shown in the column labeled “C” in the parameter
tables where appropriate.
Table A-1. Parameter Classifications
MC9S08AC16 Series Data Sheet, Rev. 0
PRELIMINARY
Table A-2
NOTE
may affect device reliability or cause
SS
or V
DD
).
299

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