lh28f640 Sharp Microelectronics of the Americas, lh28f640 Datasheet - Page 17

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lh28f640

Manufacturer Part Number
lh28f640
Description
64m X16 Flash Memory
Manufacturer
Sharp Microelectronics of the Americas
Datasheet

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1.2.1 Capacitance
NOTE:
1. Sampled, not 100% tested.
1.2.2 AC Input/Output Test Conditions
Input Capacitance
RST# Input Capacitance
Output Capacitance
Figure 5. Transient Equivalent Testing Load Circuit
Parameter
V
0.0
CC
AC test inputs are driven at V
Input timing begins, and output timing ends at V
Worst case speed conditions are when V
(1)
Figure 4. Transient Input/Output Reference Waveform for V
(T
INPUT
A
= 25 C, f=1MHz)
Symbol
C
C
C
OUT
IN
IN
V
CC
CC
(min) for a Logic "1" and 0.0V for a Logic "0".
/2
CC
V
Condition
V
V
OUT
=V
LHF64FZ2
IN
IN
=0.0V
=0.0V
CC
=0.0V
TEST POINTS
(min).
CC
/2. Input rise and fall times (10% to 90%) < 5ns.
Table 9. Configuration Capacitance Loading Value
Test Configuration
V
Min.
CC
=2.7V-3.6V
CC
=2.7V-3.6V
Typ.
24
10
6
V
CC
/2
OUTPUT
Max.
30
12
8
C
L
50
Rev. 2.41
(pF)
Unit
pF
pF
pF
15

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