lh28f128bfht-pbtl75a Sharp Microelectronics of the Americas, lh28f128bfht-pbtl75a Datasheet - Page 23

• Manufacturer Part Number: lh28f128bfht-pbtl75a
• Description: Flash Memory 16mbit 8mbitx16
• Manufacturer: Sharp Microelectronics of the Americas

1.2.1 Capacitance
NOTE:
1. Sampled, not 100% tested.
1.2.2 AC Input/Output Test Conditions
Input Capacitance
WP#/ACC Input Capacitance
Output Capacitance
Figure 5. Transient Equivalent Testing Load Circuit
Parameter
V
DEVICE
UNDER
CCQ
CL Includes Jig
TEST
0.0
AC test inputs are driven at V
Input timing begins, and output timing ends at V
Worst case speed conditions are when V
Capacitances.
(1)
Figure 4. Transient Input/Output Reference Waveform for V
(T
INPUT
A
V
=+25°C, f=1MHz)
CCQ
(min)/2
Symbol
C
C
C
1N914
OUT
R L =3.3KΩ
C L
IN
IN
V
CCQ
CCQ
OUT
/2
(min) for a Logic "1" and 0.0V for a Logic "0".
CC
V
Condition
V
V
OUT
=V
LHF12F17
IN
IN
CC
=0.0V
=0.0V
=0.0V
TEST POINTS
CCQ
(min).
/2. Input rise and fall times (10% to 90%) < 5ns.
Table 11. Test Configuration Capacitance Loading Value
Test Configuration
V
CC
Min.
=2.7V-3.3V
CC
=2.7V-3.3V
Typ.
18
4
6
V
CCQ
/2
OUTPUT
Max.
22
10
7
C
L
50
(pF)
Rev. 0.04
Unit
pF
pF
pF
20