mfrc500 NXP Semiconductors, mfrc500 Datasheet - Page 124

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mfrc500

Manufacturer Part Number
mfrc500
Description
Highly Integrated Iso14443a Reader Ic
Manufacturer
NXP Semiconductors
Datasheet

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Philips Semiconductors
Product Specification Rev. 3.2;December 2005
Highly Integrated ISO 14443A Reader IC
MF RC500
19.5 Examples of Analog- and Digital Test Signals
®
Fig. 22 shows a MIFARE
Classic Card’s answer to a request command using the Qclock receiving path.
RX –Reference is given to show the Manchester modulated signal at the RX pin. This signal is demodulated
and amplified in the receiver circuitry VRXAmpQ shows the amplified side band signal having used the Q-
Clock for demodulation. The signals VCorrDQ and VCorrNQ generated in the correlation circuitry are
evaluated and digitised in the evaluation and digitizer circuitry. VEvalR and VEvalL show the evaluation
signal of the right and left half bit. Finally, the digital test-signal S_data shows the received data which is sent
to the internal digital circuit and S_valid indicates that the received data stream is valid.
Figure 20. Receiving path Q-Clock
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