74f50109 NXP Semiconductors, 74f50109 Datasheet - Page 6

• Manufacturer Part Number: 74f50109
• Description: Synchronizing Dual J-k Positive Edge-triggered Flip-flop With Metastable Immune Characteristics
• Manufacturer: NXP Semiconductors

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
4. Measure I
Philips Semiconductors
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the
operating free air temperature range.)
RECOMMENDED OPERATING CONDITIONS
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NOTES:
September 14, 1990
V
V
I
V
I
T
T
V
V
V
I
I
I
T
SYMBOL
SYMBOL
IN
OUT
Ik
OH
OL
SYMBOL
V
V
V
I
I
I
I
I
amb
stg
amb
CC
IN
OUT
CC
IH
IL
I
IH
IL
OS
CC
Synchronizing dual J–K positive edge-triggered
flip-flop with metastable immune characteristics
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OH
OL
IK
CC
Supply voltage
Input voltage
Input current
Voltage applied to output in high output state
Current applied to output in low output state
Operating free air temperature range
Storage temperature range
Supply voltage
High–level input voltage
Low–level input voltage
Input clamp current
High–level output current
Low–level output current
Operating free air temperature range
High–level output voltage
Low–level output voltage
Input clamp voltage
Input current at maximum input voltage
High–level input current
Low–level input current
Short circuit output current
Supply current
with the clock input grounded and all outputs open, then with Q and Q outputs high in turn.
CC
4
PARAMETER
(total)
= 5V, T
OS
tests should be performed last.
amb
3
Jn, Kn
CPn, SDn, RDn
= 25 C.
PARAMETER
PARAMETER
V
MAX,
V
V
MAX,
V
V
V
V
V
V
V
V
CC
IH
CC
IH
CC
CC
CC
CC
CC
CC
CC
= MIN
= MIN
= MIN, V
= MIN, V
= MIN, I
= MAX, V
= MAX, V
= MAX, V
= MAX, V
= MAX
= MAX
OS
6
, the use of high-speed test apparatus and/or sample-and-hold
I
IL
IL
= I
I
I
I
I
= 7.0V
= 2.7V
= 0.5V
= 0.5V
=
=
IK
CONDITIONS
TEST
I
I
OH
OL
= MAX
= MAX
1
MIN
4.5
2.0
0
10%V
10%V
5%V
5%V
CC
CC
CC
CC
LIMITS
NOM
5.0
MIN
–0.5 to +7.0
–65 to +150
–0.5 to V
-60
–0.5 to +7.0
2.5
2.7
–30 to +5
RATING
0 to +70
40
LIMITS
TYP
-0.73
0.30
0.30
3.4
22
CC
74F50109
Product specification
MAX
–18
+70
5.5
0.8
–1
20
2
MAX
0.50
0.50
-250
-150
-1.2
100
-20
20
32
UNIT
UNIT
mA
mA
mA
mA
mA
UNIT
V
V
V
V
V
V
mA
mA
C
C
C
V
V
V
V
V
A
A
A
A