AN2074 Freescale Semiconductor / Motorola, AN2074 Datasheet - Page 30

• Manufacturer Part Number: AN2074
• Description: DSP56300 JTAG Examples
• Manufacturer: Freescale Semiconductor / Motorola

JTAG_CLAMP_SEQ:
START
JTAG_CLAMP:
3.8 EXTEST Example
30
EXTEST Example
The EXTEST example shows how the EXTEST instruction is executed. After the SAMPLE/PRELOAD
instruction executes as discussed in Section 3.6, SAMPLE/PRELOAD Example, on page 25, the Select-IR
scan path is selected to shift in the EXTEST instruction by sending 0000 on
register has been preloaded with a 144-bit data, the signals
the signals
instruction which selects the Bypass Register to be connected between
instruction selects the boundary scan register to be connected between
off-chip via the boundary outputs and to receive test data off-chip via the boundary inputs.Table 13
describes the instructions used in Example 16.
org
dc
dc
dc
dc
dc
dc
dc
dc
dc
dc
dc
org
...
jsr
jsr
jsr
debug
move
jsr
rts
B3
0
0
0
0
0
0
0
1
A[17–4]
x:
$30
$30
$10
$10
$14
$04
$14
$24
$30
$10
$00
p:$100
JTAG_RTI
JTAG_SAMPLE
JTAG_CLAMP
#JTAG_CLAMP_SEQ,r0
JTAG_EXECUTE
B2
0
0
0
1
1
1
1
1
are set to logic 0 after the EXTEST instruction is executed. Unlike the CLAMP
; go to Select DR
; go to Select IR
; go to Capture IR
; go to Shift IR
; go to Shift IR - 1
; go to Shift IR - 0
; go to Shift IR - 1
; go to Exit IR
; go to Update IR
; go to Run-Test-Idle
; EXIT
B1
0
0
1
0
0
1
1
1
Freescale Semiconductor, Inc.
Table 13. EXTEST Example Instructions
For More Information On This Product,
B0
0
1
0
0
1
0
1
1
Example 15. CLAMP Example
DSP56300 JTAG Examples
- 0
Go to: www.freescale.com
EXTEST
SAMPLE/PRELOAD
IDCODE
HIGHZ
CLAMP
ENABLE_ONCE
DEBUG_REQUEST
BYPASS
Instruction
AA1
,
AA2
Boundary-Scan Register
Boundary-Scan Register
ID Register
Bypass
Bypass
OnCE Register
OnCE Register
Bypass
,
CAS
TDI
TDI
Register Selected
,
and
and
A[3–0]
TDI
TDO
TDO
. Since the boundary scan
are set to logic 1 and
, the EXTEST
to drive test data