USBLC6-2 STMicroelectronics, USBLC6-2 Datasheet - Page 6
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USBLC6-2
Manufacturer Part Number
USBLC6-2
Description
VERY LOW CAPACITANCE ESD PROTECTION
Manufacturer
STMicroelectronics
Datasheet
1.USBLC6-2.pdf
(14 pages)
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Technical information
Important:
2.4
2.4.1
6/14
Figure 9.
Vout
Vin
A good precaution to take is to put the protection device as close as possible to the
disturbance source (generally the connector).
Crosstalk behavior
Crosstalk phenomenon
Figure 11. Crosstalk phenomenon
The crosstalk phenomenon is due to the coupling between 2 lines. The coupling factor ( 12
or 21) increases when the gap across lines decreases, particularly in silicon dice. In the
above example the expected signal on load R
has got an extra value
crosstalk phenomenon of the line 1 on the line 2. This phenomenon has to be taken into
account when the drivers impose fast digital data or high frequency analog signals in the
disturbing line. The perturbed line will be more affected if it works with low voltage signal or
high load impedance (few k ).
ESD response to IEC 61000-4-2
(+15 kV air discharge)
V
G1
V
G2
DRIVERS
R
G1
R
21
G2
V
G1
. This part of the V
Line 1
Line 2
Figure 10. ESD response to IEC 61000-4-2
Vout
Vin
L2
is
G1
2
signal represents the effect of the
V
(-15 kV air discharge)
RECEIVERS
G2
R
L2
, in fact the real voltage at this point
R
L1
2
V
G2
+
1
21
V
V
G1
G1
+
12
USBLC6-2
V
G2