CD016G0PFA Advanced Micro Devices, Inc., CD016G0PFA Datasheet - Page 5

• Manufacturer Part Number: CD016G0PFA
• Description: 16 Megabit(512 K X 32-Bit),CMOS 2.5 Volt-only Burst Mode, Dual Boot, Simultaneous Read/write Flash Memory
• Manufacturer: Advanced Micro Devices, Inc.

Absolute Maximum Ratings . . . . . . . . . . . . . . . . . .68
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . .69
March 22, 2004 S29CD016_00A0
mand ......................................................................................................... 56
SecSi Sector Protection Bit Program Command ........................ 56
PPB Lock Bit Set Command .............................................................. 56
DYB Write Command ........................................................................ 57
Password Unlock Command ............................................................. 57
PPB Program Command ..................................................................... 57
All PPB Erase Command .................................................................... 58
DYB Write .............................................................................................. 58
PPB Lock Bit Set .................................................................................... 58
DYB Status .............................................................................................. 58
PPB Status ............................................................................................... 58
PPB Lock Bit Status .............................................................................. 59
Non-volatile Protection Bit Program And Erase Flow ............. 59
DQ7: Data# Polling .............................................................................. 62
RY/BY#: Ready/Busy# ......................................................................... 64
DQ6: Toggle Bit I .................................................................................. 64
DQ2: Toggle Bit II ................................................................................ 65
Reading Toggle Bits DQ6/DQ2 ........................................................ 65
DQ5: Exceeded Timing Limits .......................................................... 67
DQ3: Sector Erase Timer .................................................................. 67
Table 19. Memory Array Command Definitions (x32 Mode) .....60
Table 20. Sector Protection Command Definitions (x32 Mode) .61
Figure 6. Data# Polling Algorithm ....................................... 63
Figure 7. Toggle Bit Algorithm ............................................ 66
Table 21. Write Operation Status ........................................67
Figure 8. Maximum Negative Overshoot Waveform................ 68
Figure 9. Maximum Positive Overshoot Waveform ................. 68
Industrial (I) Devices ......................................................................................................68
Extended (E) Devices ....................................................................................................68
V
V
Figure 10. I
CC
IO
Supply Voltages .......................................................................................................68
Supply Voltages ......................................................................................................68
CC1
Current vs. Time (Showing Active and Automatic
A d v a n c e
I n f o r m a t i o n
S29CD016G
Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . .71
Key to Switching Waveforms . . . . . . . . . . . . . . . . 71
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 72
Erase and Programming Performance . . . . . . . . 87
Latchup Characteristics . . . . . . . . . . . . . . . . . . . . . 87
PQFP and Fortified BGA Pin Capacitance. . . . . . 87
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . . 88
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . . 90
Sleep Currents)................................................................ 70
Figure 11. Typical I
Figure 12. Test Setup ....................................................... 71
Table 22. Test Specifications .............................................. 71
Figure 13. Input Waveforms and Measurement Levels ........... 71
Figure 14. V
Figure 15. Conventional Read Operations Timings................. 73
Figure 16. Burst Mode Read (x32 Mode) .............................. 75
Figure 17. Asynchronous Command Write Timing ................. 76
Figure 18. Synchronous Command Write/Read Timing........... 76
Figure 19. RESET# Timings ............................................... 77
Figure 20. WP# Timing ..................................................... 78
Figure 21. Program Operation Timings ................................ 80
Figure 22. Chip/Sector Erase Operation Timings ................... 81
Figure 23. Back-to-back Cycle Timings ................................ 81
Figure 24. Data# Polling Timings
(During Embedded Algorithms) .......................................... 82
Figure 25. Toggle Bit Timings
(During Embedded Algorithms) .......................................... 82
Figure 26. DQ2 vs. DQ6 for Erase/Erase Suspend Operations . 83
Figure 27. Synchronous Data Polling Timing/Toggle Bit Timings 83
Figure 28. Sector Protect/Unprotect Timing Diagram............. 84
Figure 29. Alternate CE# Controlled Write Operation Timings . 86
Performance Characteristics .......................................................................................90
Ordering Information ....................................................................................................90
Table 12 and Table 13 .....................................................................................................90
Asynchronous Read Operations Table ....................................................................90
CC
and V
CC1
IO
vs. Frequency.................................. 70
Power-up Diagram ........................... 72
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