PM5380-BI PMC-Sierra, Inc., PM5380-BI Datasheet - Page 57
PM5380-BI
Manufacturer Part Number
PM5380-BI
Description
Network Interface, SATURN User Network Interface (8x155) Telecom Standard Product
Manufacturer
PMC-Sierra, Inc.
Datasheet
1.PM5380-BI.pdf
(440 pages)
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Proprietary and Confidential to PMC-Sierra, Inc., and for its customers’ internal use.
Document No.: PMC- 2010299, Issue 2
9.8
JTAG Test Access Port (TAP) Signals
Pin Name
A[13]
RSTB
ALE
INTB
Pin Name
TCK
TMS
TDI
TDO
Type
Input
Output
Type
Input
Output
Input
Input
Input
Input
Pin
No.
C18
Pin
No.
E19
C19
D24
A24
A22
D18
C20
S/UNI®-8x155 ASSP Telecom Standard Product Data Sheet
The active-low reset (RSTB) signal provides an
Function
The test register select (A[13]) signal selects between normal
and test mode register accesses. A[13] is high during test
mode register accesses, and is low during normal mode
register accesses. A[13] may be tied low.
asynchronous S/UNI-8x155 reset. RSTB is a Schmitt
triggered input with an integral pull-up resistor.
CSB must be held high when RSTB is low in order to
properly reset this chip.
The address latch enable (ALE) is active-high and latches
the address bus A[12:0] when low. When ALE is high, the
internal address latches are transparent. It allows the S/UNI-
8x155 to interface to a multiplexed address/data bus. ALE
has an integral pull-up resistor.
The active-low interrupt (INTB) signal is set low when a
S/UNI-8x155 interrupt source is active and that source is
unmasked. The S/UNI-8x155 may be enabled to report
many alarms or events via interrupts.
Examples of interrupt sources are loss of signal (LOS), loss
of frame (LOF), line AIS, line remote defect indication (LRDI)
detect, loss of pointer (LOP), path AIS, path remote defect
indication and others.
INTB is tri-stated when the all enabled interrupt sources are
acknowledged via an appropriate register access. INTB is an
open drain output.
Function
The test clock (TCK) signal provides clock timing for test
operations that are carried out using the IEEE P1149.1 test
access port. This pin has an internal pull-up resistor.
The test mode select (TMS) signal controls the test
operations that are carried out using the IEEE P1149.1 test
access port. TMS is sampled on the rising edge of TCK.
TMS has an integral pull-up resistor.
The test data input (TDI) signal carries test data into the
S/UNI-8x155 via the IEEE P1149.1 test access port. TDI is
sampled on the rising edge of TCK. TDI has an integral pull-
up resistor.
The test data output (TDO) signal carries test data out of the
S/UNI-8x155 via the IEEE P1149.1 test access port. TDO is
updated on the falling edge of TCK. TDO is a tristate output
which is inactive except when shifting boundary scan data is
in progress.
Released
57
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