ADUC816 Analog Devices, ADUC816 Datasheet - Page 18

• Manufacturer Part Number: ADUC816
• Description: Precision Analog Microcontroller: 1MIPS 8052 MCU + 8kB Flash + Dual 16-Bit ADC + 12-Bit DAC
• Manufacturer: Analog Devices

Specifications of ADUC816

• Mcu Core: 8052
• Mcu Speed (mips): 1.3
• Sram (bytes): 256Bytes
• Gpio Pins: 34
• Adc # Channels: 4

ADuC816
ABSOLUTE MAXIMUM RATINGS
(T
Parameter
AV
AV
DV
DV
AGND to DGND
AV
Analog Input Voltage to AGND
Reference Input Voltage to AGND
AIN/REFIN Current (Indefinite)
Digital Input Voltage to DGND
Digital Output Voltage to DGND
Operating Temperature Range
Storage Temperature Range
Junction Temperature
Lead Temperature, Soldering
Vapor Phase (60 sec)
Infrared (15 sec)
1
2
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
AGND and DGND are shorted internally on the ADuC816.
Applies to P1.2 to P1.7 pins operating in analog or digital input modes.
JA
JA
A
DD
DD
DD
DD
DD
Thermal Impedance (MQFP)
Thermal Impedance (LFCSP
= 25°C unless otherwise noted)
Base Floating)
to AGND
to DGND
to DV
to AGND
to DGND
DD
1
2
Ratings
−0.3 V to +7 V
−0.3 V to +7 V
−0.3 V to +7 V
−0.3 V to +7 V
−0.3 V to +0.3 V
−2 V to +5 V
−0.3 V to AV
−0.3 V to AV
30 mA
−0.3 V to DV
−0.3 V to DV
−40°C to +85°C
−65°C to +150°C
150°C
90°C/W
52°C/W
215°C
220°C
DD
DD
DD
DD
+0.3 V
+0.3 V
+0.3 V
+0.3 V
–18–
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
REV. A