RC28F128P33BF60A Micron Technology Inc, RC28F128P33BF60A Datasheet - Page 48

• Manufacturer Part Number: RC28F128P33BF60A
• Manufacturer: Micron Technology Inc

Specifications of RC28F128P33BF60A

• Lead Free Status / Rohs Status: Supplier Unconfirmed

15.0
15.1
Figure 14: AC Input/Output Reference Waveform
Note:
Figure 15: Transient Equivalent Testing Load Circuit
Notes:
1.
2.
3.
.
Table 22: Test Configuration Component Value for Worst Case Speed Conditions
Figure 16: Clock Input AC Waveform
Datasheet
48
VCCQ Min Standard Test
AC test inputs are driven at VCCQ for Logic "1" and 0 V for Logic "0." Input/output timing begins/ends at VCCQ/2. Input
rise and fall times (10% to 90%) < 5 ns. Worst-case speed occurs at VCC = VCC
See the following table for component values.
Test configuration component value for worst case speed conditions.
C
L
V
includes jig capacitance
0V
CCQ
AC Characteristics
AC Test Conditions
CLK [C]
Input V
Test Configuration
CCQ
V
V
/2
R202
IH
IL
Under Test
Device
R201
Test Points
R203
C
L
Out
Min
.
C
V
L
CCQ
(pF)
30
/2 Output
Order Number: 208034-04
IO_REF.WMF
P33-65nm
Jul 2011