P80C557E4EFB NXP Semiconductors, P80C557E4EFB Datasheet - Page 67

• Manufacturer Part Number: P80C557E4EFB
• Manufacturer: NXP Semiconductors

Specifications of P80C557E4EFB

• Cpu Family: 80C
• Device Core: 80C51
• Device Core Size: 8b
• Frequency (max): 16MHz
• Interface Type: I2C/UART
• Program Memory Type: ROMLess
• Program Memory Size: Not Required
• Total Internal Ram Size: 1KB
• # I/os (max): 40
• Number Of Timers - General Purpose: 3
• Operating Supply Voltage (typ): 5V
• Operating Supply Voltage (max): 5.5V
• Operating Supply Voltage (min): 4.5V
• On-chip Adc: 8-chx10-bit
• Instruction Set Architecture: CISC
• Operating Temp Range: -40C to 85C
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 80
• Package Type: PQFP
• Lead Free Status / Rohs Status: Compliant

Philips Semiconductors
1999 Mar 02
NOTE:
AC inputs during testing are driven at 2.4V for a logic ‘HIGH’ and 0.45V for a logic
‘LOW’. Timing measurements are made at 2.0 V for a logic ‘HIGH’ and 0.8 V for a
logic ‘LOW’.
Single-chip 8-bit microcontroller
0.45 V
2.4 V
PORT 0
PORT 2
PSEN
ALE
Figure 58. AC Testing Input/Output
2.0 V
0.8 V
Test Points
t
LHLL
t
AVLL
V
IH1
A0–A7
Figure 60. External Program Memory Read Cycle
t
2.0 V
0.8 V
CLKH
Figure 57. External Clock Drive waveform
t
t
LLAX
LLPL
t
AVIV
V
IH1
t
LLIV
0.8V
A8–A15
t
PLAZ
t
t
t
CLKL
t
PLIV
PXIX
PLPH
t
CLKR
INSTR IN
67
P83C557E4/P80C557E4/P89C557E4
NOTE:
The float state is defined as the point at which a port 0 pins sinks 3.2 mA or
t
sources 400 A at the voltage test levels.
CLK
0.45 V
0.8V
t
2.4 V
PXIZ
V
IH1
Figure 59. AC Testing, Float Waveform
V
IH1
2.0 V
0.8 V
A0–A7
t
CLKF
Float
A8–A15
2.0 V
0.8 V
Product specification
2.4 V
0.45 V