IDT79R3041-25PF IDT, Integrated Device Technology Inc, IDT79R3041-25PF Datasheet - Page 16
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IDT79R3041-25PF
Manufacturer Part Number
IDT79R3041-25PF
Description
IC MPU 32BIT 5V 25MHZ 100-TQFP
Manufacturer
IDT, Integrated Device Technology Inc
Datasheet
1.IDT79R3041-20PF8.pdf
(34 pages)
Specifications of IDT79R3041-25PF
Processor Type
RISC 32-Bit
Speed
25MHz
Voltage
5V
Mounting Type
Surface Mount
Package / Case
100-TQFP, 100-VQFP
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Features
-
Other names
79R3041-25PF
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
IDT79R3041-25PF
Manufacturer:
IDT, Integrated Device Technology Inc
Quantity:
10 000
Company:
Part Number:
IDT79R3041-25PF8
Manufacturer:
IDT, Integrated Device Technology Inc
Quantity:
10 000
Company:
Part Number:
IDT79R3041-25PFG
Manufacturer:
IDT, Integrated Device Technology Inc
Quantity:
10 000
Company:
Part Number:
IDT79R3041-25PFG8
Manufacturer:
IDT, Integrated Device Technology Inc
Quantity:
10 000
IDT79R3041 INTEGRATED RISController FOR LOW COST SYSTEMS
AC ELECTRICAL CHARACTERISTICS R3041 (CONT.)
NOTES:
1. All timings referenced to 1.5 Volts, with a rise and fall time of less than 2.5ns.
2. All outputs tested with 25pF loading.
3. The AC values listed here reference timing diagrams contained in the R3041 Hardware User's Manual.
4. Guaranteed by design.
5. This parameter is used to derate the AC timings according to the loading of the system. This parameter provides a deration for loads over the specified
6. Timings t34 - t44 are reserved for other RISController family members.
ABSOLUTE MAXIMUM RATINGS
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS
2. V
3. Not more than one output should be shorted at a time. Duration of the short
AC TEST CONDITIONS RV3041
Symbol
Symbol
t45
t46
t47
t48
t49
t50
t51
t52
tderate
Symbol
V
T
V
V
V
V
T
test condition; that is, the deration factor is applied for each 25pF over the specified test load condition.
TERM
may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
V
should not exceed 30 seconds.
V
T
BIAS
STG
IH
IL
IHS
ILS
IN
IN
IN
C
minimum = –3.0V for pulse width less than 15ns.
should not exceed V
ExtDataEn
ExtDataEn
IOStrobe
ExtDataEn
ExtDataEn
MemStrobe
MemStrobe
MemStrobe
All outputs
Terminal Voltage with
Respect to GND
Operating Case Temperature
Temperature Under Bias
Storage Temperature
Input Voltage
Input HIGH Voltage
Input LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Signals
Parameter
,
DataEn
Rating
CC
+0.5 Volts.
Tri-state from
(after driven condition)
Driven from
(after driven condition)
Valid from
Asserted from
Negated from
Asserted from
Negated from
Asserted from Addr(3:0) valid
Timing deration for loading
over 25pF
Description
Min.
3.0
3.0
—
—
(4, 5)
SysClk
SysClk
Commercial
–0.5 to +7.0
–55 to +125
–55 to +125
–0.5 to +7.0
SysClk
SysClk
SysClk
SysClk
SysClk
0 to +85
(1, 3)
Max.
falling
—
—
0
0
falling
rising
rising
falling
rising
rising
RV3041
2905 tbl 08
Unit
(4)
2905 tbl 06
V
V
V
V
Unit
V
V
C
C
C
RECOMMENDED OPERATING
TEMPERATURE AND SUPPLY VOLTAGE
OUTPUT LOADING FOR AC TESTING
V
+1.5V
Min.
Commercial
—
—
—
—
—
—
—
—
REF
0
16.67MHz
RV3041
Grade
+
Max.
-
0.5
13
13
10
15
19
19
—
9
Signal
All Signals
Min.
—
—
—
—
—
—
—
—
0
Temperature
0 C to +85 C
20MHz
(Case)
Max.
0.5
10
10
12
15
15
—
8
7
COMMERCIAL TEMPERATURE RANGE
Min.
+4mA
-4mA
—
—
—
—
—
—
—
—
0
25MHz
Max.
0.5
10
10
15
15
—
7
9
6
GND
0V
Cld
25 pF
Min.
—
—
—
—
—
—
—
—
0
33MHz
C
LD
3.3 5%
Max.
To Device
Under Test
0.5
10
10
15
15
—
7
9
6
V
2905 drw 07
CC
2905 tbl 09
2905 tbl 12
2905 tbl 07
25pF
16
Unit
ns/
ns
ns
ns
ns
ns
ns
ns
ns