EPF10K100EFC484-1 Altera, EPF10K100EFC484-1 Datasheet - Page 47

• Manufacturer Part Number: EPF10K100EFC484-1
• Description: IC FLEX 10KE FPGA 100K 484-FBGA
• Manufacturer: Altera
• Series: FLEX-10KE®r

Specifications of EPF10K100EFC484-1

• Number Of Logic Elements/cells: 4992
• Number Of Labs/clbs: 624
• Total Ram Bits: 49152
• Number Of I /o: 338
• Number Of Gates: 257000
• Voltage - Supply: 2.375 V ~ 2.625 V
• Mounting Type: Surface Mount
• Operating Temperature: 0°C ~ 85°C
• Package / Case: 484-FBGA
• Family Name: FLEX 10KE
• Number Of Usable Gates: 100000
• Number Of Logic Blocks/elements: 4992
• # Registers: 338
• # I/os (max): 338
• Frequency (max): 333.33MHz
• Process Technology: CMOS
• Operating Supply Voltage (typ): 2.5V
• Logic Cells: 4992
• Ram Bits: 49152
• Device System Gates: 257000
• Operating Supply Voltage (min): 2.375V
• Operating Supply Voltage (max): 2.625V
• Operating Temp Range: 0C to 85C
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Pin Count: 484
• Package Type: FC-FBGA
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Other names: 544-1935; EPF10K100EFC484-1

Altera Corporation
Generic Testing
Operating
Conditions
V
V
V
I
T
T
T
Symbol
Table 19. FLEX 10KE 2.5-V Device Absolute Maximum Ratings
OUT
STG
AMB
J
CCINT
CCIO
I
Supply voltage
DC input voltage
DC output current, per pin
Storage temperature
Ambient temperature
Junction temperature
Parameter
Each FLEX 10KE device is functionally tested. Complete testing of each
configurable static random access memory (SRAM) bit and all logic
functionality ensures 100% yield. AC test measurements for FLEX 10KE
devices are made under conditions equivalent to those shown in
Figure
all stages of the production flow.
Figure 21. FLEX 10KE AC Test Conditions
Tables 19
recommended operating conditions, DC operating conditions, and
capacitance for 2.5-V FLEX 10KE devices.
Power supply transients can affect AC
measurements. Simultaneous transitions of
multiple outputs should be avoided for
accurate measurement. Threshold tests
must not be performed under AC
conditions. Large-amplitude, fast-ground-
current transients normally occur as the
device outputs discharge the load
capacitances. When these transients flow
through the parasitic inductance between
the device ground pin and the test system
ground, significant reductions in
observable noise immunity can result.
Numbers in brackets are for 2.5-V devices
or outputs. Numbers without brackets are
for 3.3-V. devices or outputs.
21. Multiple test patterns can be used to configure devices during
With respect to ground
No bias
Under bias
PQFP, TQFP, BGA, and FineLine BGA
packages, under bias
Ceramic PGA packages, under bias
through
FLEX 10KE Embedded Programmable Logic Devices Data Sheet
23
provide information on absolute maximum ratings,
Conditions
(2)
Note (1)
Device
Output
Device input
rise and fall
times < 3 ns
8.06 k
[481
[481
703
]
]
–0.5
–0.5
–2.0
Min
–25
–65
–65
5.75
Max
C1 (includes
JIG capacitance)
150
135
135
150
3.6
4.6
25
System
VCCIO
Unit
Test
mA
° C
° C
° C
° C
V
V
V
47