5962-8960101B2A QP SEMICONDUCTOR, 5962-8960101B2A Datasheet - Page 23

• Manufacturer Part Number: 5962-8960101B2A
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8960101B2A

• Logic Family: ACT
• Technology: CMOS
• Number Of Bits: 8
• Number Of Elements: 1
• Clock-edge Trigger Type: Positive-Edge
• Polarity: Non-Inverting
• Operating Supply Voltage (typ): 5V
• Propagation Delay Time: 13.5ns
• Output Type: 3-State
• Low Level Output Current: 24mA
• High Level Output Current: -24mA
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Operating Temp Range: -55C to 125C
• Operating Temperature Classification: Military
• Mounting: Surface Mount
• Pin Count: 20
• Lead Free Status / Rohs Status: Not Compliant

DSCC FORM 2234
APR 97
table II herein. For device class S steady-state life tests, the test circuit shall be maintained by the manufacturer and shall be
made available to the acquiring or preparing activity upon request.
4.4.3 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.3.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
4.4.2 Group B inspection. When applicable, the group B inspection end-point electrical parameters shall be as specified in
b.
c.
2/ PDA applies to subgroup 1 (see 4.2.3). For device classes S and V, PDA applies to subgroups 1 and 7 (see 4.2.3).
3/ The burn-in shall meet the requirements of 4.2.1a herein.
4/ On all class S lots, the device manufacturer shall maintain read-and-record data (as a minimum on disk) for burn-in
5/ Delta limits shall be required only on table I, subgroup 1. The delta values shall be computed with reference to the
6/ The device manufacturer may at his option either complete subgroup 1 electrical parameter measurements, including
a. Test condition A, B, C or D. The test circuit shall be maintained be the manufacturer under document revision level
electrical parameters (group A, subgroup 1), in accordance with test method 5004 of MIL-STD-883. For pre-burn-in and
interim electrical parameters the read-and-record requirements are for delta measurements only.
previous interim electrical parameters. The delta limits are specified in table III.
delta measurements, within 96 hours after burn-in completion (removal of bias); or may complete subgroup 1 electrical
measurements without delta measurements within 24 hours after burn-in completion (removal of bias). When the
manufacturer elects to perform the subgroup 1 electrical parameter measurements without delta measurements, there is
no requirement to perform the pre-burn-in electrical tests (first interim electrical parameters test in table II).
DEFENSE SUPPLY CENTER COLUMBUS
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
A
= +125°C, minimum.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
STANDARD
Quiescent supply current
Supply current delta
Input current low level
Input current high level
Output voltage low level
(I
Output voltage high level
(I
OL
OH
TABLE III. Burn-in and operating life test, delta parameters (+25°C).
1/
2/
= 24 mA, V
= -24 mA, V
These parameters shall be recorded before and after the required
burn-in and life tests to determine delta limits.
Guaranteed, if not tested.
Parameter 1/
TABLE II. Electrical test requirements – Continued.
CC
CC
= 5.5 V)
= 5.5 V)
I
Symbol
CCH,
∆I
I
V
V
CCZ
I
I
IL
IH
OH
OL
CC
I
CCL
SIZE
A
Device type
01
02
02
02
02
02
02
REVISION LEVEL
Delta limits
±100 nA 2/
±0.4 mA
±300 nA
±0.04 V
±0.20 V
±20 nA
±20 nA
E
SHEET
5962-89601
23