5962-8960101B2A QP SEMICONDUCTOR, 5962-8960101B2A Datasheet - Page 22

• Manufacturer Part Number: 5962-8960101B2A
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8960101B2A

• Logic Family: ACT
• Technology: CMOS
• Number Of Bits: 8
• Number Of Elements: 1
• Clock-edge Trigger Type: Positive-Edge
• Polarity: Non-Inverting
• Operating Supply Voltage (typ): 5V
• Propagation Delay Time: 13.5ns
• Output Type: 3-State
• Low Level Output Current: 24mA
• High Level Output Current: -24mA
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Operating Temp Range: -55C to 125C
• Operating Temperature Classification: Military
• Mounting: Surface Mount
• Pin Count: 20
• Lead Free Status / Rohs Status: Not Compliant

DSCC FORM 2234
APR 97
Interim electrical parameters,
Static burn-in I, method 1015
Interim electrical parameters,
Static burn-in II, method 1015
Interim electrical parameters,
Dynamic burn-in I, method 1015
Interim electrical parameters,
Final electrical parameters,
Group A test requirements,
Group B end-point electrical
Group C end-point electrical
Group D end-point electrical
Group E end-point electrical
method 5004
(see 4.2)
(see 4.2.1a)
method 5004 (see 4.2.1b)
(see 4.2.1a)
method 5004 (see 4.2.1b)
(see 4.2.1a)
method 5004 (see 4.2.1b)
method 5004
method 5005 (see 4.4.1)
parameters, method 5005
(see 4.4.2)
parameters, method 5005
(see 4.4.3)
parameters, method 5005
(see 4.4.4)
parameters, method 5005
(see 4.4.5)
e.
1/ Blank spaces indicate tests are not applicable.
d.
f.
g. For device classes B, S, Q, and V, t
DEFENSE SUPPLY CENTER COLUMBUS
Test requirements
For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table in figure 3 herein. The test
vectors used to verify the truth table shall, at a minimum, test all functions of each input and output. All possible input
to output logic patterns per function shall be guaranteed, if not tested, to the truth table in figure 3, herein. For device
classes B, S, Q, and V, subgroups 7 and 8 shall include verifying the functionality of the device.
For device classes B, S, Q, and V, f
For device classes B, S, Q, and V, subgroups 9 and 11 tests shall be measured only for initial qualification and after
process or design changes which may affect dynamic performance.
changes which may affect the device frequency. Test all applicable pins on 22 devices with zero failures.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
STANDARD
method 5005, table I)
1, 2, 3, 4, 7, 8, 9, 10,
(in accordance with
1, 2, 3, 7, 8, 9 2/
MIL-STD-883,
Subgroups 1/
MAX
s
TABLE II. Electrical test requirements.
, t
class M
Device
1, 2, 3
1, 2, 3
1, 7, 9
h
, and t
11
shall be measured only for initial qualification and after process or design
3/
3/
3/
W
shall be guaranteed, if not tested, to the limits specified in
Required 6/
1, 2, 3, 4, 7,
8, 9, 10, 11
Device 2/
1, 2, 7, 9
required
required
1 2/ 5/
class B
1, 2 5/
1, 7, 9
2/ 6/
Not
Not
1, 2
1
SIZE
A
Required 4/
Required 4/
Required 4/
1, 2, 3, 4, 7,
1, 2, 3, 7, 8,
9, 10, 11 5/
8, 9, 10, 11
MIL-PRF-38535, table III)
Device 2/
1, 2, 7, 9
1 2/ 5/
class S
REVISION LEVEL
1, 2, 3
1, 7, 9
(in accordance with
1 5/
1 5/
2/
1
Subgroups 1/
E
Required 6/
1, 2, 3, 7, 8,
1, 2, 3, 4, 7,
8, 9, 10, 11
1, 2, 3 5/
9, 10, 11
required
required
class Q
1 2/ 5/
Device
1, 2, 3
1, 7, 9
2/ 6/
Not
Not
1
SHEET
5962-89601
1, 2, 3, 7,8,
8, 9, 10, 11
7, 8, 9, 10,
1, 2, 3, 4,
1, 2, 3, 7,
Required
Required
Required
9, 10, 11
1 2/ 5/
class V
Device
1, 2, 3
1, 7, 9
1 5/
1 5/
11
4/
4/
4/
2/
1
5/
22
table I.