AD1674KNZ Analog Devices Inc, AD1674KNZ Datasheet - Page 19

• Manufacturer Part Number: AD1674KNZ
• Description: IC ADC 12BIT 100KSPS 28-DIP
• Manufacturer: Analog Devices Inc

Specifications of AD1674KNZ

• Data Interface: Parallel
• Number Of Bits: 12
• Sampling Rate (per Second): 100k
• Number Of Converters: 1
• Power Dissipation (max): 825mW
• Voltage Supply Source: Dual ±
• Operating Temperature: 0°C ~ 70°C
• Mounting Type: Through Hole
• Package / Case: 28-DIP (0.600", 15.24mm)
• Resolution (bits): 12bit
• Sampling Rate: 100kSPS
• Input Channel Type: Single Ended
• Supply Voltage Range - Digital: 4.5V To 5.5V
• Supply Current: 14mA
• Digital Ic Case Style: DIP
• Number Of Elements: 1
• Resolution: 12Bit
• Architecture: SAR
• Sample Rate: 100KSPS
• Input Polarity: Unipolar/Bipolar
• Input Type: Voltage
• Rated Input Volt: 10/20/±5/±10V
• Differential Input: No
• Power Supply Requirement: Dual
• Single Supply Voltage (typ): Not RequiredV
• Single Supply Voltage (min): Not RequiredV
• Single Supply Voltage (max): Not RequiredV
• Dual Supply Voltage (typ): ±12/±15V
• Dual Supply Voltage (min): ±11.4V
• Dual Supply Voltage (max): ±16.5V
• Power Dissipation: 575mW
• Integral Nonlinearity Error: ±0.5LSB
• Operating Temp Range: 0C to 70C
• Operating Temperature Classification: Commercial
• Mounting: Through Hole
• Pin Count: 28
• Package Type: PDIP W
• Input Signal Type: Single-Ended
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

DSCC FORM 2234
APR 97
assured (see 3.5 herein).
classes Q and V or MIL-PRF-38535, appendix A for device class M.
(original equipment), design applications, and logistics purposes.
prepared specification or drawing.
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users
and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering
microelectronic devices (FSC 5962) should contact DSCC-VA, telephone [phone].
[phone].
MIL-PRF-38535 and MIL-HDBK-1331.
The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DSCC-VA and have agreed to
this drawing.
The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been
submitted to and accepted by DSCC-VA.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor
6.1.2 Substitutability. Device class Q devices will replace device class M devices.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus when a system
6.4 Comments. Comments on this drawing should be directed to DSCC-VA , Columbus, Ohio 43216-5000, or telephone
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.
6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.
a.
b.
c.
DEFENSE SUPPLY CENTER COLUMBUS
End-point electrical parameters shall be as specified in table II herein.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All
device classes must meet the post irradiation end-point electrical parameter limits as defined in table I at T
When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied.
5 C, after exposure, to the subgroups specified in table II herein.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
STANDARD
SIZE
A
REVISION LEVEL
A
SHEET
5962-93164
A
19
= +25 C