AD1674KNZ Analog Devices Inc, AD1674KNZ Datasheet - Page 18

• Manufacturer Part Number: AD1674KNZ
• Description: IC ADC 12BIT 100KSPS 28-DIP
• Manufacturer: Analog Devices Inc

Specifications of AD1674KNZ

• Data Interface: Parallel
• Number Of Bits: 12
• Sampling Rate (per Second): 100k
• Number Of Converters: 1
• Power Dissipation (max): 825mW
• Voltage Supply Source: Dual ±
• Operating Temperature: 0°C ~ 70°C
• Mounting Type: Through Hole
• Package / Case: 28-DIP (0.600", 15.24mm)
• Resolution (bits): 12bit
• Sampling Rate: 100kSPS
• Input Channel Type: Single Ended
• Supply Voltage Range - Digital: 4.5V To 5.5V
• Supply Current: 14mA
• Digital Ic Case Style: DIP
• Number Of Elements: 1
• Resolution: 12Bit
• Architecture: SAR
• Sample Rate: 100KSPS
• Input Polarity: Unipolar/Bipolar
• Input Type: Voltage
• Rated Input Volt: 10/20/±5/±10V
• Differential Input: No
• Power Supply Requirement: Dual
• Single Supply Voltage (typ): Not RequiredV
• Single Supply Voltage (min): Not RequiredV
• Single Supply Voltage (max): Not RequiredV
• Dual Supply Voltage (typ): ±12/±15V
• Dual Supply Voltage (min): ±11.4V
• Dual Supply Voltage (max): ±16.5V
• Power Dissipation: 575mW
• Integral Nonlinearity Error: ±0.5LSB
• Operating Temp Range: 0C to 70C
• Operating Temperature Classification: Commercial
• Mounting: Through Hole
• Pin Count: 28
• Package Type: PDIP W
• Input Signal Type: Single-Ended
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

DSCC FORM 2234
APR 97
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of
MIL-STD-883.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.
a.
b.
c.
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method
1005 of MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
DEFENSE SUPPLY CENTER COLUMBUS
A
= +125 C, minimum.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
1/ PDA applies to subgroup 1.
Interim electrical
Final electrical
Group A test
Group C end-point electrical
Group D end-point electrical
Group E end-point electrical
parameters (see 4.2)
parameters (see 4.2)
requirements (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
Test requirements
STANDARD
TABLE II. Electrical test requirements.
1
1,2,3,9 1/
1,2,3,4,5,6,9,10,11
1
1
method 5005, table I)
(in accordance with
MIL-STD-883,
Subgroups
class M
Device
---
SIZE
A
1
1,2,3,9 1/
1,2,3,4,5,6,
9,10,11
1
1
MIL-PRF-38535, table III)
class Q
Device
(in accordance with
---
REVISION LEVEL
Subgroups
1
1,2,3,9 1/
1,2,3,4,5,6,
9,10,11
1,2,3
1,2,3
A
class V
Device
---
SHEET
5962-93164
18