5962-8873504LA QP SEMICONDUCTOR, 5962-8873504LA Datasheet - Page 8

• Manufacturer Part Number: 5962-8873504LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8873504LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
Valid output from E low
Inactive output from E
1/ For devices using the synchronous enable, the device must be clocked after applying these voltages to perform this
2/ These are absolute voltages with respect to device ground pin and include all over shoots due to system or tester noise.
3/ For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30
4/ This parameter tested initially and after any design or process changes which may affect this parameter, therefore, shall be
5/ Applies only when the synchronous ( E
6/ Transition is measured at steady-state high level -500 mV or steady-state low level +500 mV on the output from the 1.5 V
7/ Applies only when the synchronous ( E ) function is used.
high 4/, 6/, 7/
4/, 7/
measurement.
seconds.
guaranteed to the limits specified in table I.
level on the input with loads shown on figure 3, circuit B.
DEFENSE SUPPLY CENTER COLUMBUS
Test
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
1/ * PDA applies to subgroup 1 and 7.
2/ ** See 4.3.1c.
3/ Any subgroups at the same temperature may be combined when using a
4/ For all electrical tests, the device shall be programmed to the pattern specified.
STANDARD
Interim electrical parameters
Final electrical test parameters (method
5004) for unprogrammed devices
Final electrical test parameters (method
5004) for programmed devices
Group A test requirements (method
5005)
Groups C and D end-point electrical
parameters (method 5005)
multifunction tester.
(method 5004)
t
t
Symbol
DOE
HZE
MIL-STD-883 test requirements
TABLE I. Electrical performance characteristics – Continued.
See figures 3 and 4
TABLE II. Electrical test requirements. 1/, 2/, 3/, 4/
unless otherwise specified
S
) function is used.
-55°C ≤ T
4.5 V ≤ V
GND = 0 V
Conditions
C
CC
≤+125°C
≤ 5.5 V
1*, 2, 3, 7*, 8
1*, 2, 3, 7*, 8, 9
1, 2, 3, 4**, 7, 8, 9, 10, 11
(in accordance with MIL-STD-883,
SIZE
A
2, 3, 7, 8
subgroups
9, 10, 11
9, 10, 11
Group A
method 5005, table I)
Subgroups
REVISION LEVEL
---
Device
02, 03
02, 03
types
01
04
01
04
E
Min
Limits
SHEET
Max
30
20
15
30
20
15
5962-88735
8
Unit
ns
ns